Page 73 - Power Electronics Handbook
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66  Thermal design
                        starting at fl and -Prn starting at f2. The junction temperature rise at time r3
                        is then given by  equation (2.5).
                          d  T(ts)  = pm Rth(t,)  - pm Rth(b)
                                = pin [Rth(t,)  - &h(k)]                            (2.5)
                          The  case  of  multiple-power pulses,  shown  in  Figure 2.5(b),  can  be
                        considered as a series of single superimposed pulses, and the temperature
                        rise at time f7  is given by equation (2.6).

                         dT(,)  = pm1 [Rth(t,)  - R*h(tJI  + pm2 [4h(t3) - Rth(t,)l
                                   f pm3  [Rth(b) - Rth(Ql                         (2.6)
                          In the pulse train situation, shown in Figure 2.5(c), the last few pulses
                        are the  only ones making individual contributions, and the rest can be
                        averaged, so that the temperature rise is given by  equation (2.7).





                          The last example of  transient operation to be considered here is that of a
                        non-rectangular  pulse.  This  can  be  approximated  into  a  series  of
                        rectangular pulses, as in Figure 2.5(d). The temperature rise at time fm is
                        now given by equation (2.8).
                         dT(a prnl Rth(t,) + (pm2 - pml) Rth(tJ  + (pm3  - pm2) Rth(Q) +
                                =
                                =    {pm(n)  - Pm(n - I))Rth(f)                     (2.8)

                        2.4 Heatsinks
                        The thermal capacity (cth)  of a device, which provides a measure of its rate
                        of change of thermal energy with temperature, is given by equation (2.9).

                         cth  = C.m                                                 (2.9)
                        where m is the mas of  the device and C its specific heat.
                          Heatsinks are usually used to improve the thermal capacity of  power
                        semiconductors  and  therefore  to  enable  them  to  dissipate  the  heat
                        generated when they are in operation. This section first looks at thermal
                        equations, which provide a guide to the various methods of cooling power
                        devices, and then describes the heatsinking methods which may be used.

                        2.4.1  Thermal equations
                        Three  methods exist  for removing  heat  from  a  power  semiconductor,
                        conduction, convection, and radiation, and these are described by thermal
                        equations.
                        Conduction.  The  rate  of  heat  flow  across  a  heatsink,  having  a
                        cross-sectional area of a,  a thickness of d, and a thermal conductivity of kT,
                        is given by equation (2.10),  where dT is the temperature difference across
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