Page 111 - Wire Bonding in Microelectronics
P. 111

90     Cha pte r  F o u r


                    0.12                                       3.0
                                                   A


                    0.10      10 mm (0.4 in) bond length       2.5

                  Loop height (in)  0.08  5 mm (0.2 in) bond length  B  2.0 Loop height (mm, approximate)



                                                               1.5
                    0.06

                    0.04              2.5 mm (0.1 in) bond length  C  1.0



                    0.02                                       0.5
                       0      4      8      12     16     20
                                    Wire elongation (%)

              FIGURE 4-7  The effect of wire elongation on the fi nal loop height at the point
              of wire rupture during a bond pull test. All bonds had the same initial loop
              height, 0.5 mm (20 mils), but three different bond-to-bond lengths were used
              as indicated.





                       600
                                                               A

                                                               C
                       500      2.5 mm (100 mil) bond length   B
                     Bond pull strength (gf)  400  5.0 mm (200 mil) bond length
                                   10.2 mm (400 mil) bond length




                       300


                       200



                       100
                         0       4      8      12     16     20
                                       Wire elongation (%)

              FIGURE 4-8  Bond-pull force and wire breaking force versus wire elongation.
              The solid curves are bond-pull forces based on the geometries of similar
              lettered curves in Fig. 4-7.
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