Page 9 - Wire Bonding in Microelectronics
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                          4B.5  The Current Status of the NDPT (2008)
                                for Critical Space Applications   . . . . .   125
                     References   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   126
                5  Gold-Aluminum Intermetallic Compounds and
                   Other Metallic Interface Reactions in Wire
                   Bonding   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   131
                     5.1  Gold-Aluminum Intermetallic Compound
                         Formation and Classical Wire-Bond
                         Failures   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   131
                          5.1.1  Introduction   . . . . . . . . . . . . . . . . . . . . .   131
                          5.1.2  Intermetallic Compound Formation in
                                the Au-Al System   . . . . . . . . . . . . . . . .   132
                          5.1.3  The Classical Au-Al Compound
                                Failure Modes   . . . . . . . . . . . . . . . . . . .   139
                          5.1.4  Reversing the Au-Al Metallurgical
                                Interfaces   . . . . . . . . . . . . . . . . . . . . . . .   144
                          5.1.5  The Effect of Diffusion Inhibitors and
                                Barriers   . . . . . . . . . . . . . . . . . . . . . . . . .   146
                     5.2 Impurity-Accelerated Au-Al
                         Bond Failures   . . . . . . . . . . . . . . . . . . . . . . . . . . .   148
                          5.2.1  The Effect of Halogens on the Au-Al
                                Bond System   . . . . . . . . . . . . . . . . . . . .   148
                          5.2.2  Recommendations for Removing or
                                Avoiding Halogen Contamination   . . .   151
                          5.2.3  Nonhalogen Epoxy Outgassing
                                Induced Bond Failures   . . . . . . . . . . . .   153
                          5.2.4  Green Mold Compound Problems   . . .   153
                     5.3  Nongold-Aluminum Bond Interfaces  . . . . . . .   154
                          5.3.1 Aluminum-Copper Wire-Bond
                                System   . . . . . . . . . . . . . . . . . . . . . . . . . .   154
                          5.3.2  Aluminum Bond Pads Containing Copper,
                                Causing Bonding
                                Problems   . . . . . . . . . . . . . . . . . . . . . . . .   156
                          5.3.3  Copper-Gold Wire Bond
                                System   . . . . . . . . . . . . . . . . . . . . . . . . . .   157
                          5.3.4  Palladium-Au and -Al Bonding
                                System (Used Primarily for
                                Lead Frames)   . . . . . . . . . . . . . . . . . . . .   158
                          Ball Bonding with Pd Wire   . . . . . . . . . . . . . .   160
                          5.3.5  The Silver-Aluminum Wire
                                Bond System   . . . . . . . . . . . . . . . . . . . .   160
                          5.3.6  Aluminum-Nickel Wire Bond
                                System   . . . . . . . . . . . . . . . . . . . . . . . . . .   163
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