Page 12 - Wire Bonding in Microelectronics
P. 12

Co n t e n t s    xi


                          8.1.7 Silicon Nodule-Induced
                                Cratering   . . . . . . . . . . . . . . . . . . . . . . .   263
                          8.1.8  Cratering Over Polysilicon   . . . . . . . .   266
                          8.1.9  Gallium Arsenide Cratering   . . . . . . .   266
                          8.1.10  Conclusions of Cratering   . . . . . . . . .   269
                     8.2  Cracks in the Heels of Ultrasonic
                         Wedge Bonds   . . . . . . . . . . . . . . . . . . . . . . . . . . .   270
                     8.3  The Effect of Acceleration, Vibrations, and
                         Shock on Open-Cavity Packages   . . . . . . . . . .   273
                          8.3.1  Centrifuge Test for Wire Bond
                                Reliability on Wire Bonds   . . . . . . . . . .   273
                          8.3.2  The Effect of Ultrasonic Cleaning,
                                Launch Vehicles Pyro-shocks,
                                Vibrations, etc., on Open-Cavity-
                                Package Wire Bonds   . . . . . . . . . . . . . .   275
                          8.3.3  The Effect of Shock and Vibration
                                Tests on Wire Bonds (Problems with
                                Long Wires)    . . . . . . . . . . . . . . . . . . . . .   278
                     8.4  Effects of Power and Temperature Cycling
                         of Wire Bonds   . . . . . . . . . . . . . . . . . . . . . . . . . . .   279
                     Appendix 8A  Fracture Toughness Defi ned Fracture
                         Toughness is the Stress Required to Extend an
                         Existing Crack   . . . . . . . . . . . . . . . . . . . . . . . . . .   284
                     Appendix 8B  Design of Experiments (DOE) for
                         Wire Bonder Setup   . . . . . . . . . . . . . . . . . . . . . .   284
                          Introduction   . . . . . . . . . . . . . . . . . . . . . . . . . . .   284
                          The Math is in the Software, the Value You
                          Add is Your Engineering Knowledge . . . . . . .   285
                          What’s a Statistic, Effect, and Interaction   . .   285
                          What is a DOE?   . . . . . . . . . . . . . . . . . . . . . . . .   286
                          Choosing Variables and Ranges   . . . . . . . . . .   286
                          Sequential Experimentation   . . . . . . . . . . . . .   288
                          Process Capability   . . . . . . . . . . . . . . . . . . . . . .   288
                          Experiments to Improve Yield   . . . . . . . . . . .   289
                          Gage R&R   . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   289
                          Conclusions   . . . . . . . . . . . . . . . . . . . . . . . . . . .   289
                     References    . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   290
                9  Advanced and Specialized Wire Bonding
                   Technologies   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   293
                     9.1  The Technology and Problems of High
                         Yield and Ever-Finer Pitch Wire Bonding,
                         and Specialized Looping   . . . . . . . . . . . . . . . . .   293
                          9.1.1  Introduction to High Yield in Modern
                                Wire Bonding   . . . . . . . . . . . . . . . . . . . .   293
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