Page 46 - Building A Succesful Board-Test Strategy
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32  BUILDING A SUCCESSFUL BOARD-TEST STRATEGY




































 Figure 1-10  Actual electronics manufacturer's cumulative fault spectrum for all of a
 facility's board types during a recent 1-year period.




    Figure 1-11 provides a different view of the same manufacturer's data. This
 time, the analysis shows failure rates for individual board types. Clearly, types A
 and B fail more than three times as often as any of the others. Therefore, reduc-
 ing failure rates for these two types would have the greatest impact on total product
 quality. In addition, examining the fault spectrum for each board type might show
 more process-type failures for types A and B, while a higher percentage of failures
 in types C through / results from design-related causes. Therefore, a strategy that
 works very well for A and B would not necessarily represent the optimum choice
 for the other types.
    Looking at these two charts together might suggest that the large number of
 component failures comes primarily from assemblies A and B. Perhaps they
 contain ASICs or other high-failure components that the other assemblies do not.
 Such reasoning in no way guarantees that correlation, but it gives the engineer a
 starting point for analysis.
    The issue of what you are trying to test also depends heavily on who the cus-
 tomer is. In some cases, for example, a government agency may dictate certain
 aspects of the test strategy, such as choice of equipment or location for field test-
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