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28                                                 Materials and Fabrication Techniques

                 limitation can be overcome in design by avoiding large disparities in the feature sizes
                 on the mask.


                 2.3.4 Surface Micromachining

                 Although the most popular sensor fabrication technology is bulk micromachining
                 using deep wet or dry etching below the surface of the silicon, surface micromachin-
                 ing provides a complementary technique in which materials are added above the sur-
                 face. These materials often act as spacers or sacrificial layers to be removed at a later
                 stage to produce freestanding structures and moveable parts. A typical surface-
                 micromachined structure, illustrated in Figure 2.15, uses silicon dioxide as the sacri-
                 ficial layer and polysilicon for the structural layer [20]. In the most basic process the
                 oxide is usually deposited by CVD because this etches more rapidly than thermally
                 grown oxides. Holes are etched in the oxide to form anchor points for the structural
                 layer. Polysilicon is then deposited and patterned and the oxide is etched laterally
                 beneath the structure in a hydrofluoric acid etch. The structures thus formed can be
                 designed to move either horizontally or vertically, in and out of the plane of the
                 wafer. Complex structures can be made by stacking four or five alternating layers of
                 polysilicon and silicon dioxide. Although other sacrificial and structural layer com-
                 binations, such as polysilicon and silicon nitride [21], nickel and copper [22], and
                 copper and Ni/Fe [23], have been employed, the oxide and polysilicon combination
                 has been by far the most prevalent. The challenges with surface micromachining are
                 to control the mechanical properties of the structural layer to prevent the formation
                 of internal residual stresses and to ensure that the released structures do not stick to
                 the surface of the wafer after they are dried. Preventing stress in the polysilicon layer
                 is done by carefully controlling the deposition and annealing conditions. Another
                 method is to deposit alternate layers of amorphous silicon at 570°C, which is tensile,
                 and polysilicon at 615°C, which is compressive [4]. In surface micromachining,
                 structures are generally released by wet etching the sacrificial layer followed by rins-
                 ing in water. This gives rise to capillary forces as the wafers are dried causing the
                 structures to stick to the underlying substrate. Many methods for preventing this
                 stiction have been developed. One approach is to process the wafers through a series



                                             (a)



                                             (b)




                                             (c)


                                             (d)

                 Figure 2.15  Typical surface-micromachined structure: (a) oxide deposited and etched; (b)
                 polysilicon deposited; (c) polysilicon patterned and etched to create access holes through to the
                 oxide; and (d) oxide etched selectively in HF to leave freestanding polysilicon structures.
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