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Microelectromechanical Systems and Microstructures in Aerospace 365

TABLE 16.7
Acceptance Testing
EMI/EMC
Comprehensive performance test (CPT)
Random vibration
Limited performance test (LPT)
Thermal cycle or vacuum (CPT or LPT testing performed
at extremes, as approved by the project)
Burn-in
Comprehensive performance test (CPT)
Mass properties
Alignments (if required)

16.5.1.6 Comprehensive Performance Testing
A comprehensive performance test (CPT) shall be conducted on each component.
When environmental testing is performed, additional CPT shall be conducted
during the hot and cold extremes of the temperature or thermal-vacuum test for
both maximum and minimum input voltage, and at the conclusion of the environ-
mental test sequence, as well as at other times as prescribed. The CPT shall be a
detailed demonstration that the hardware and software meet their performance
requirements within allowable tolerances. The test shall demonstrate operation of
all redundant circuitry (if applicable) and satisfactory performance in all operational
modes within practical limits of cost, schedule, and environmental simulation
capabilities. The initial CPT shall serve as a baseline against which the results of
all later CPTs can be readily compared. The test shall demonstrate that, when
provided with appropriate inputs, internal performance is satisfactory and outputs
are within acceptable limits.

16.5.1.7 Limited Performance Testing
Limited performance tests (LPT) shall be performed before, during, and after environ-
mental tests, as appropriate, in order to demonstrate that functional capability has not
been degraded by the tests. The limited tests are also used in cases where compre-
hensive performance testing is not warranted or not practicable. LPTs shall demon-
strate that the performance of selected hardware and software functions is within
acceptable limits. Specific times when LPTs will be performed shall be as prescribed.

16.6 FINAL INTEGRATION
Following successful environmental test, the MEMS incorporated in systems, sub-
systems, or instruments will move into integration and test (I&T) with the

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