Page 399 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
P. 399

APPLICATIONS     379

  in humidity. Therefore,  the uncoated  side  is used for measuring the temperature, which is
  then  used to compensate  for  temperature  changes  in  the  humidity  measurement  from  the
  coated  side.  There  are  up  to  three  phase  shifters  (not  shown) in  front  of  each  reflector.
  The unique arrangement  of  these  phase  shifters  gives  the  sensors  their  unique identifica-
  tion number, which can also be determined  by the wireless  system based  on the reflected
  electromagnetic  signal.  The  bus  is  connected  to  the  two  terminals  of  each  IDT  and this
  is  inductively  coupled  with the  sensor  antenna through an air  gap.
     The  SiO2  coating  used  on  the  wireless  humidity sensor  is 40  to  50 nm  thick  and  was
  deposited  using  plasma-enhanced  chemical  vapour  deposition  (PECVD).  A  glass  mask
  was  prepared  to deposit the  film only on the  area  indicated  in  Figure  13.17. The coating
  is  amorphous and porous  to  give it a high  sensitivity  to  water vapour.
     In  order  to  protect  the  IDTs  and  reflectors,  they  should  be  coated  with  a  very  thin
  (about  1 um) layer  of a passivation  layer  that  is  not  affected  by  moisture.  One  candidate
  is amorphous silicon nitride (SiN xH y). SiN xH y has excellent passivation properties, which
  make  it  ideal  for  use  in  the  semiconductor  industry  as  an  insulator  and  as  a  protective
  layer  for  silicon  devices.  SiN xH y  can  be  deposited  from  the  reaction  of  silane  (SiH4)
  with  either  ammonia  (NH 3) or  nitrogen  (N2). Using  plasma  to  assist  in  the  deposition,
  these films are deposited  at much lower temperatures than by any other techniques (about
  350 °C instead  of  more  than  750 °C).
     Figure  13.18(a) shows the experimental  setup for remote  humidity measurement using
  wireless  and  passive  SAW  sensors.  The  main  components  of  the  system  consist  of  the
  SAW  sensor,  the  transceiver,  central  interface  unit  (CIU),  and  computer.  A  commercial
  RH  sensor  (Omega RH82) is also  placed  inside  the humidity chamber  for calibration  and
  verification.
     SAW devices  based on a LiNbO 3 substrate with part of the substrate coated with a thin
  layer  of  humidity-sensitive  silicon  dioxide  are  used.  The  delay  line  in  the  SAW  sensor
  is  now  sensitive to  changes  in humidity as the  silicon  dioxide  adsorbs  moisture  from  the
  humid  air. The  transceiver  emits  RF pulses that  are picked  up by  the SAW sensor;  these
  pulses  are  converted  to  acoustic  waves  on  the  surface  of  the  sensor,  which  are  further
  reflected  by  the  uniquely  spaced  reflectors.  The  reflected  signal  received  back  by  the
  transceiver contains  the  sensor  information.  This  signal passes  through the  CIU in which
  all  the  signal  processing  takes  place  and  then  the  processed  data is  sent  to the  computer
  through  the  serial interface.
     The  phase  difference between  two  reflectors along  the  coated  part  of  the  propagation
  path  can  be  used  as  a  measure  of  the  humidity.  The  RH  of  the  enclosed  chamber  is
  changed  by pumping nitrogen  into  the  chamber  through a bubbler. The bubbler wets the
  nitrogen  gas,  which  when  introduced  into  the  chamber,  causes  the  humidity inside  the
  chamber  to  increase.
     The following graph, Figure  13.18(b),  shows the plot between RH, as measured  by the
  commercial humidity  sensor,  and the phase change in the humidity sensor, as measured by
  the transceiver and computer system. It can  be  seen  that the phase  change varies linearly
  with  RH.
     The  straight  line,  shown  in  Figure  13.18(b),  has  been  fitted  to  the  experimental  data
  using  least  squares. The equation  of the fitted line is  <p =  1.4 percent  RH +  75.9.  There-
  fore,  as  stated  earlier,  because  the  wireless  system  has  a  phase  difference  measurement
  resolution of  1°, this  system is  able  to provide  an excellent  resolution  of  0.69  percent  RH
  measurements.
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