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WAFER PREPARATION     63

     4.2  WAFER    PREPARATION
     4.2.1  Crystal  Growth


     As  stated  in  the  preceding  text, silicon  is the  most commonly used semiconductor mate-
     rial  for  making  microelectronic  devices.  Other  semiconductor  materials  are  employed in
     certain  important  niche  areas,  for  example,  gallium  arsenide  (GaAs)  for  optoelectronic
     devices and silicon  carbide  and gallium nitride  (GaN) for high-power  or  high-temperature
     devices, but  silicon is by  far  the dominant material  not only for  standard microelectronic
     components but  also  for microtransducers  and MEMS  devices.
       Silicon  is  one  of  the  earth's  most  abundant elements  forming  about  25  percent  of
     its  surface  crust. However,  silicon  reacts  readily  with oxygen and  other  materials  in  the
     earth's  atmosphere  and hence  is  generally  found in the form of  sand  (i.e.  silicon  dioxide
     (SiO 2))  or  silicates.  Sand  can  be  found  with  an  impurity  level  of  less  than  1 percent,
     and this composition  is usually  the starting point for making single-crystal  silicon  wafers.
     The process  has three main steps: first, refining  the  sand into polycrystailine silicon rods;
     second, growing the single-crystal silicon rods, known as boules; and third, producing the
     wafers  suitable  for  monolithic  processing  (see  Section  4.3).
       The  first  step is  achieved  by  placing  this  relatively  pure  form  of  sand, quartzite, into
     a  furnace  with  a  common  source,  such  as  coal,  coke,  or  wood  chips,  of  carbon.  The
     silicon  dioxide  (SiO 2)  is  reduced  by  carbon  and  the  condensed  silicon  vapour  to  form
     metallurgical-grade  silicon (98  to  99 percent pure):


                          SiO 2(s) +  2C(s)  Si(s) +  2CO(g)              (4.1)


     Next, the metallurgical-grade  silicon  is further  purified  by heating it up in  an atmosphere
     of  hydrogen  chloride  (HC1) to  form  the  compound  trichlorosilane  (SiHCl 3):


                        Si(s) +  3HCl(g)    SiHCl 3(g) +  H 2(g)           (4.2)


     The  trichlorosilane  is  cooled  to  form  a  liquid  at  room  temperature  (boiling  point  is
     32 °C) and is easily  purified  to  semiconductor standards by a fractional distillation  proce-
     dure.  The  distillation  procedure  removes  the unwanted chlorides  of  metallic  and  dopant
     impurities,  such  as  copper,  iron,  phosphorous,  and  boron.  Finally,  the  thermal  reduc-
     tion  of  trichlorosilane  gas  in  a  chemical  vapour  deposition  (CVD)  reactor  produces
     electronic-grade  polycrystailine  silicon,  which  is  deposited  onto  a  slim  pure  silicon  rod
     (see Figure 4.2).
                        SiHCl 3(g) + H 2(g)   Si(s) +  3HCl(g)             (4.3)


       The  electronic-grade  silicon  rods  are  typically  20 cm  in  diameter  and  several  metres
     in  length, and  these  are  used  to  grow  single-crystalline silicon  by  either  the  Czochralski
     or  the  zone-melt  process.
       The present-day Czochralski process is based on the process invented by Czochralski in
     1917 for the growth of single crystals of metals. It consists of dipping a single-crystal seed
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