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20 ELECTRICAL CONDUCTIVE CNT DISPERSED Si N CERAMICS                          APPLICATIONS
                                                  3  4
                      100
                                                                      2SiO(g)   3C s()   2SiC(s)    CO g)
                                                                                               (
                                                                                              2
                       90                                             Si N s()    3 C s()  3 SiC(s)    2 N g)
                     Relative density (%)  80                    These chemical reactions must follow gas formation
                                                                                               (
                                                                                               2
                                                                       3
                                                                          4
                                                                 and depend on the partial pressure of SiO and N .
                                                                                                          2
                       70
                                                                 For instance, SiC is in a stable phase at 1,600 C
                                                                               2
                                                                 of open pores, the above reactions advance by dis-
                       60      Y 2 O 3 -Al 2 O 3 -TiO 2 -AlN     under 1.0 MPa N [9]. If the sintered body has a lot
                               Y O -Al O 3                       charging the gas out of the sample like previous
                                    2
                                  3
                                2
                                                                 study [10, 11]. However, if the pores become closed
                       50
                         0          5         10         15      during sintering, the gas formation reactions should
                                                                 be restrained and CNTs remain in the sample. In the
                                 CNT content (wt%)
                                                                 system of Si N –Y O –Al O –TiO –AlN, CNTs
                                                                                    3
                                                                                  2
                                                                                               2
                                                                                          3
                                                                                        2
                                                                               4
                                                                             3
                                                                 remained in the sample in spite of their characteris-
                  Figure 20.3                                    tics since it was densified at lower temperature to
                  Relative density of CNT-dispersed Si N ceramics.  form closed pores before the reaction between CNTs
                                               4
                                             3
                                                                 and SiO or Si N .
                                                                               4
                                                                       2
                                                                             3
                                                                  Hot isostatic pressing treatment was carried out in
                                                                 order to evaluate mechanical properties of the elec-
                                                                 troconductive Si N 4  ceramics. Furthermore, the
                                                                               3
                  1.8 wt% CNTs. The residual CNTs decreased as more  ceramics was fabricated by hotpressing. As a result,
                  CNTs were added, and CNTs were not found in the  more CNTs remained in the hotpressed samples.
                  sample with over 4.2 wt% CNTs.                 Table 20.1 shows the mechanical properties of CNT
                    Fig. 20.3 depicts the relative density of Si N 4  dispersed Si N ceramics. The CNT-dispersed Si N 4
                                                          3
                                                                           3
                                                                                                         3
                                                                             4
                  ceramics fabricated using  Y O –Al O –TiO –AlN  ceramics made by the authors has higher strength
                                                2
                                                        2
                                                   3
                                             3
                                           2
                  by the gas-pressure sintering technique. The relative  (722 MPa produced by gas-pressure sintering and
                  density exceeded 92% in the sample with 1.8 wt%  hot isostatic pressing, and 1,173 MPa produced by
                  CNTs, though it decreased slightly with an increas-  hotpressing) than previous ceramics due to the
                  ing amount of CNTs due to the inhibition of densi-  excellent sinterability of the Si N –Y O –Al O –
                                                                                                  2
                                                                                               4
                                                                                                    3
                                                                                             3
                                                                                                          3
                                                                                                        2
                  fication by CNTs.  Thus, electroconductive and  TiO –AlN system. Fracture toughness of CNT-
                                                                    2
                  dense Si N ceramics by addition of CNTs can be  dispersed Si N ceramics, fabricated by gas-pressure
                           4
                         3
                                                                             4
                                                                           3
                  realized.                                      sintering followed by hot isostatic pressing and hot-
                    XRD analysis confirmed that the sample with up to  pressing, is 6.6 and 6.5 MPa m , and hardness is
                                                                                           1/2
                  1.8 wt% CNT exhibited the same XRD profile as the  14.3 and 14.8 GPa, respectively. These are nearly
                  sample without CNT, namely only  -Si N and TiN  the  same values as the sample without CNTs.
                                                   3
                                                     4
                  were identified. SiC was found to be included in the
                  Si N ceramics with over 2.4 wt% CNT addition.
                    3
                      4
                  When a larger amount of CNT was added,
                   -sialon was also found in the sample, which means  Table 20.1
                  that there was a reaction between CNTs and liquid  Mechanical properties of CNT dispersed Si N ceramics.
                  phase at high temperature because   -sialon is                                3  4
                  expected to be generated from the liquid at high N                1.8 wt%  1.8 wt%  No CNTs
                  concentration [8]. However, when Y O and Al O 3                    CNTs    CNTs   GPS-HIP
                                                          2
                                                   3
                                                 2
                  were used as sintering aids, the density was lowered             GPS-HIP    HP
                  (Fig. 20.3), SiC was formed and the residual CNTs
                  could not be observed in the Si N ceramics. SiC  Relative density   96.4    98.3     98.1
                                                4
                                             3
                  should be formed in the following reaction between  (%)                                 5
                  CNTs and SiO , which is the main component of the  Electrical conductivity   30  79    10
                              2
                                                                     1
                  grain boundary glassy phase and/or Si N itself.   (Sm )
                                                 3  4
                                                                 Bending strength   721      904      950
                                                                 (MPa)
                           (,
                       SiO s l)   C s)  SiO g)    CO g)          Fracture toughness   6.6      6.5      6.5
                                               (
                                         (
                                 (
                                                                      1/2
                          2
                                                                 (MPa m )
                                                                 Vicker’s hardness   14.3     14.8     15.2
                       SiO(g)   2C s()   SiC(s)   CO(g)          (GPa)
                                                                                                        499
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