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FUNDAMENTALS                             CH. 1 BASIC PROPERTIES AND MEASURING METHODS OF NANOPARTICLES

                        Amorphous    Tetragonal  Monoclinic      on silicon and so on. For example, thinner the thick-
                                                                 ness of the dielectric layer in Multi-Layer Ceramic
                                                                 Capacitor (MLCC), larger the capacitance of the
                                                                 resultant MLCC. Deposition of the high-performance
                     Free Energy                                 on a silicon wafer can lead to the development of various
                                ΔE
                                                                 capacitors and the memories of ferroelectric thin films
                                  1
                                                                 type nanosensors and Micro-Electro-Mechanical
                                            ΔE                   Systems (MEMS).
                   ΔG                         2                   Functionalities such as piezoelectricity and ferro-
                                                                 electricity of the ferroelectric materials are originated
                                                                 from domain structure of dipole which forms by the
                   (a)                                           slight asymmetry of the crystal structure. Therefore,
                                                                 the crystal structures or the electrical properties of the
                                                                 ferroelectric thin films are significantly affected by
                                                                 the substrate and deposition technique which lead to
                                                                 the difference of the residual stress in films.  The
                                                                 control of the residual stress in the ferroelectric thin
                     Free Energy                                 actively conducting the related studies on the residual
                                                                 films is the current topic and many researchers are
                                                                 stress in ferroelectric thin films.
                                                                  The most famous ferroelectric materials are the
                                                                                   3
                   ΔG                           Smaller Particle size  barium titanate (BaTiO ) family as dielectric materi-
                                                                 als and the lead zirconate titanate (Pb(Zr, Ti)O ) fam-
                                                                                                      3
                   (b)                                           ily as piezoelectric materials. In this section, the size
                                                                 effects of these two materials are focused to discuss
                                                                 the crystal structure of the nanoparticles.
                  Figure 1.8.1
                  Free energy change for formation of metastable tetragonal  Electrical properties such as dielectric and ferro-
                  zirconia. (a) Kinetic formation theory, (b) thermodynamic  electric properties are considered to be intrinsic inde-
                  formation theory.                              pendent of the shape and size of the materials.
                                                                 However, these physical properties of the materials
                                                                 can be variable if the particle size is below several
                  Therefore, preparation conditions such as matrix,  tens of nanometers by the size effect.  Therefore,
                  atmosphere including temperature and so on signifi-  recent semiconductor industry including information
                  cantly affect the crystallization behavior or the result-  technology cannot ignore the size effect because the
                  ant crystal phase of the nanoparticles to be a  thickness of the thin films and the grain size in films
                  metastable phase or stable phase. For the case of zir-  used in the semiconductor industry ranges from
                  conia, it has been reported that the critical size which  severalnm to several tens of nanometers. First, quan-
                  permits the metastable tetragonal phase is less than  tum size effect was reported by Känzig et al. in 1953
                  30 nm [7]. On the other hand, tetragonal zirconia with  [9, 10]. Since then, many experimental [11, 12] and
                  a particle size larger than 30nm can exist in some  theoretical [13–16] approaches have been done to
                  cases if the sophisticated preparation method is used  understand this quantum effect. Especially, many
                  and the matrix exerts a strong force of constraint on  studies on the size effect of ferroelectric materials
                  the zirconia particle crystallized in a composite [8].   such as barium titanate [17] and lead titanate [18]
                    As described above, crystal structure of the  have been carried out, whereas the origin and the
                  nanoparticles can change depending on the prepara-  mechanisms of the size effect are poorly understood.
                  tion condition and technique as well as the atmos-  Ishikawa et al. proposed the surface relaxation model
                  phere including temperature and matrix and so on.  to explain the size effect, as shown in Fig. 1.8.2, where
                  Furthermore, strong force such as the milling can  D and l(D) are thickness and the particle diameter of
                  also change the crystal structure of the nanoparti-  the cubic phase, respectively.  They also determined
                  cles. Calcium carbonate and zirconia are the typical  the critical particle size of barium titanate, strontium
                  examples.
                                                                 titanate and lead titanate from the precise X-ray
                                                                 diffraction analysis [18].  The ferroelectric materials
                  1.8.2 Size effect and crystalline phases       with a particle size larger than the critical size exhibit
                  of ferroelectric materials                     ferroelectricity and the crystal symmetry of the ferro-
                                                                 electrics changes from tetragonal to cubic at this critical
                  The ferrodielectric materials are the promising mate-  size at room temperature. So far, it has been reported
                  rials as the core materials in the 21st century because  that the critical size of barium titanate (BT) was in the
                  ferroelectric thin films can make the development of  range from 20 to 200nm [17, 18] and that of lead
                  high-performance memories and the micro-actuators  titanate (PT) was in the range from 7 to 11 nm [19, 20].

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