Page 146 - Organic Electronics in Sensors and Biotechnology
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Integrated Pyr oelectric Sensors     123

                  140


                  120

                  100
                 Device thickness (nm)  80





                   60

                   40


                   20

                    0
                     –6   –5  –4   –3  –2   –1   0    1   2    3   4    5
                                          Bias voltage (V)

                               Bulk layer         BCB (Young layer)
                               Depletion layer (Young)  BCB (ideal dielectric)

               FIGURE 4.4  Thickness of the four capacitive layers of a BCB-pentacene MIS
               structure at different bias voltages obtained by impedance spectroscopy.


               4.1.3  Charge-Time Behavior of Capacitive Multilayers
               As can be seen from the example in Fig. 4.3 organic capacitive multilayer
               structures can show a significant temporal dependence when biased.
               There can be various reasons for this, e.g., mobile ions in the dielectric,
               sensitivity to light, heat, oxygen, or charging effects. One might think
               the latter reason would play a negligible role since the contact resis-
               tance is of the order of 1 kΩ, the device capacitance around 1 nF, and
               hence the charging time constant τ = RC = 1 μs. However, it will be
               shown here that for multilayer structures several charging time con-
               stants apply that can be individually significantly higher.  To under-
                                                                5
               stand the temporal charging behavior of the three-layer structure,
               first the capacitive double-layer structure is described, as it is a spe-
               cial case of the three-layer structure.


               The Capacitive Double-Layer Structure
               The equivalent circuit of a double-layer structure corresponds to a
               contact resistor R  in series with two capacitors C which respectively
                              c                         1,2
               have a leakage resistor R  in parallel (see Fig. 4.5).
                                    1,2
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