Page 59 - Photodetection and Measurement - Maximizing Performance in Optical Systems
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Fundamental Noise Basics and Calculations

            52   Chapter Three

                        TABLE 3.3 Contributions to Noise in the Bias Box
                        1mA Photocurrent
                        20MHz Bandwidth                   1kW Load                1MW Load

                        Mean DC signal             1mV                      1V
                        Dark DC offset voltage     30mV                     30mV
                        Thermal noise of load      4nV/ Hz  or 18mV rms     126nV/ Hz  or 0.56mV rms
                        Shot noise due to 30nA leakage  0.098nV/ Hz  or 0.44mV rms  98nV/ Hz  or 0.44mV rms
                        Shot noise due to photocurrent  0.57nV/ Hz  or 2.5mV rms  0.57mV/ Hz  or 2.5mV rms
                        Total noise                18.2mV rms               2.6mV rms
                        Signal-to-Noise            55                       385





                          It is clear that a higher value of load resistor gives more thermal noise.
                        However, the larger load also gives a much larger signal, with the result that
                        the S/N improves with the square root of the increasing load. With 1kW the
                        detection S/N is limited by thermal noise in the resistor, the largest of the noise
                        contributions of Table 3.3. With 1MW, however, the S/N is limited by the pho-
                        tocurrent shot noise. The system is “shot-noise limited.” The greater the pho-
                        tocurrent, the greater is the noise but the greater the S/N. The only way to
                        remove the signal shot noise contribution is to switch off the optical signal;
                        however, this is not recommended!
                          It is generally our goal to design the measurement system to be shot-noise
                        limited. This is not to say that the S/N will of necessity be adequate for our
                        measurement, just that we are making best use of the optical power available.
                        From Table 3.1 we can see that if we have high received optical power, then to
                        be shot-noise limited should bring high resolution and perhaps precision. We
                        can easily see whether a simple system is shot-noise limited by measuring the
                        voltage on the load resistor due to photocurrent. To see this, compare shot and
                        thermal noise voltage densities produced by a photocurrent I p flowing through
                        a simple load resistor R:

                                    Thermal noise voltage density  4kTR     V   Hz          (3.9)

                                    Shot noise voltage density    R  2qI p   V   Hz        (3.10)
                        Equating these two expressions, we can calculate the product:

                                                    V o =  I R = 2 kT q                    (3.11)
                                                          p
                        Hence if the signal voltage  V o due to  I p flowing in  R is bigger than about
                        2kT/q = 52mV the measurement should be limited by the shot-noise statis-
                        tics. We say “should” because other interfering signals may actually form the
                        limit to S/N. If V o < 52mV, thermal noise in the load resistor should define the
                        limit to S/N. This was the justification for not bothering to calculate the load
                        resistor noise contributions in the TRY IT! on shot noise.


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