Page 21 - Power Electronics Handbook
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14   Power semiconductor devices

                                                    Crystal
                                                    surface

























                       Figure 1.5 A crystal lattice showing the surface effect



                       1.3.2  Forward and reverse bias
                       Connecting a battery across the junction in the forward direction, that is,
                       with  its  positive terminal  connected to  the p  layer,  will decrease  the
                       depletion region, acting with the potential barrier, and cause a cutrent to
                       flow as given by



                       where  Vj  is the  voltage across the junction,  1,  is the  reverse junction
                       current,  q is the electron charge, T the absolute temperature, and k is
                       Boltzmann’s constant.
                         When  the  voltage  across the p-n  junction  is  reversed,  the  battery
                       potential helps that of the internal depletion barrier, so that only a small
                       minority current can flow. This leakage current is due to three causes:
                       (i)  Surface contamination, which can be reduced by cleaning the surface;
                           by coating it with protective material such as glasses or silicon resins;
                           or by  designing the device such that surface fields are lower than
                           internal fields. This includes bevelling and the use of surface plates,
                           as described in section 1.3.3.
                       (ii)   Diffusion  of  minority Carriers  from  the  neutral  areas  into  the
                           depletion region. Tbis is low for diodes operating below about lWC,
                           but is more significant for power devices whose junctions frequently
                           operate above this temperature. If the width of thep and n regions of
                           a reverse-biased diode are W and W,, as measured from the edge of
                           the  depletion layer; Zp ancf,,  are equilibrium concentrations of
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