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DICKE FIX                                                         diode, avalanche transit-time (ATT)  133



           and then an IF amplifier of optimum radar signal bandwidth.”  DIODE, microwave. A microwave diode is a two-electrode
           SAL                                                  microwave device. In its solid-state form it uses an electrical
           Ref.: IEEE (1990), p. 10; Johnston (1979), p. 58.    junction as a fundamental element of its structure. The junc-
                                                                tion in this type of diode is formed at the place of contact
           DIELECTRIC. A dielectric is “a material that can withstand
                                                                between metal and semiconductor or at the boundary between
           high electric stress without  appreciable conduction.”  The
                                                                two conductors with different types of conductivity (electron
           dielectric properties of a material are characterized by several
                                                                conductors are n-type and hole conductors are p-type). These
           parameters, basic to which is the dielectric constant. Dielec-
                                                                junctions are characterized by the existence of a potential bar-
           trics are represented primarily by insulators with low conduc-
                                                                rier that permits current flow in only one direction. The elec-
           tance, but semiconductors also have dielectric properties. The
                                                                trical junction may arise even in the absence of a statistical p-
           only perfect dielectric, with zero conductance, is an absolute
                                                                n junction (the Gunn effect). The majority of diodes are made
           vacuum. SAL
                                                                with  germanium (Ge), silicon  (Si), or gallium arsenide
           The (relative) dielectric constant is “the ratio of the force  (GaAs) by introducing into a monocrystal a precise quantity
           between electrical charges  in vacuum  to the  force  between  of impurities from other elements, thus altering the conduc-
           them in a specified medium” (a dimensionless constant, usu-  tivity. The choice of the semiconductor material, the type of
           ally denoted by e). The word “relative” is usually omitted but  impurity and their distribution is determined by the purpose
                         r
           is understood. In microwave components it can be considered  of the diode and the range of its application. Depending on
           as the  ratio by  which  the capacitance  is increased  when a  the application, microwave diodes are typically categorized
           given dielectric material replaces a vacuum between two elec-  as belonging to one of the following classes: detector, mixer,
           trodes. Other terms that are used interchangeably are relative  oscillator, multiplier,  and switching  diodes. Each class  of
           permittivity or  relative capacivity (see  PERMITTIVITY).  diode generally includes diodes of various types. Table D6
           SAL                                                  shows the main function and limiting conditions of applica-
           Ref.: Fink (1982), p. 1.10; Jordan (1985), pp. 4.12, 33.5; Popov (1980),   tion for various types of microwave diodes.
              p. 118.
                                                                                     Table D6
           DIFFRACTION is “the deviation of the direction of energy               Microwave Diodes
           flow of a wave when it passes an obstacle, a restricted aper-
           ture, or other inhomogeneities in the medium.” It appears as a                                  Max.
           modification of the free-space electromagnetic field resulting  Type of   Negative   Application  Max.   average
                                                                   diode  conductivity          frequency  power
           from the  interaction of the  radar  wave with  surfaces  in the
                                                                              ?                  (GHz)      (W)
           vicinity of the direct path or obstacles in the direct path. The
           amount of diffraction is a function of the wavelength of the  PN   no       detector    20       0.1
           radiation relative to the size of the interfering object; the
                                                                 PIN          no       mixer       20       10
           larger this ratio, the larger the diffraction effect. In consider-
           ing radar propagation, there are two basic types of diffraction:  Schottky  no  detector,   300  0.1
           smooth-sphere diffraction, when waves are diffracted around  barrier        mixer
           the curved earth, and knife-edge diffraction, which occurs in  tunnel  statistical  oscillator   100  10 - 5
           the presence of obstacles projecting above the surface. At                 (amplifier)
           microwave frequencies,  smooth  sphere diffraction  into the
                                                                 Gunn       dynamic   oscillator   150       1
           shadow zone is negligible, but very low frequency (VLF);
                                                                                      (amplifier)
           that is, long wavelength, electromagnetic waves are diffracted
           around the curved earth and provide the basis for worldwide  IMPATT  dynamic  oscillator   200    5
           communications. Knife-edge diffraction  occurs  in the  pres-              (amplifier)
           ence of an obstacle such as a hill, tower, or building, which  TRAP-  dynamic  oscillator   10   10
           project above the smooth-earth radar horizon in the path of  ATT           (amplifier)
           the electromagnetic wave. Behind the mask angle, due to
           wave-diffraction effects, the radar propagation factor drops to  The construction of the diode is determined by the oper-
           zero more slowly than for the smooth sphere case, enabling  ating band and the means by which it is incorporated into the
           some  radars to detect  targets in the  masked, or  shadow,  waveguide. There are socketed and coaxial housed diodes and
           region. As with smooth-sphere diffraction, this effect is more  also unhoused diodes. IAM
           pronounced for low-frequency radars, but it has been  Ref.: Fink (1982), pp. 7.38–7.42; Jordan (1985), p. 18.12; Gorbachev (1968),
           exploited at microwave frequencies by communications sys-  p. 5; Gassanov (1988), p. 72; Andrushko (1981), pp. 102, 120.
           tems. The main radar types that take advantage of diffraction  An avalanche transit-time (ATT) diode has negative con-
           effects  are high-frequency  surface-wave radars. (See  also  ductivity in the avalanche breakdown mode. A layer of ava-
           PROPAGATION.) PCH                                    lanche multiplication  of  carriers appears  at the “breakdown
           Ref.: IEEE (1993), p. 347; Barton (1988), pp. 297–302; Fink (1982),   voltage” at the junction between strongly alloyed p- and n-
              pp. 18.75–18.82; Jull (1987); Macnamara (1990).   regions. A  cluster of  electrons  formed in this layer  drifts
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