Page 632 - Sensors and Control Systems in Manufacturing

Subjective probability, 543–544 Throughput Index 585
Super-Low k (SLiK) APDs, 367 defined, 491
Surface, sensor, 343 FFT spectrometry, 493
Surface acoustic waves (SAW), 278 SpectRx NIR technology, 497
Surface mount device (SMD), 23 Time delay before availability, 93
Surface mount technology (SMT), 23 Timeliness, 536–537
Switching logic Timers, 261, 449
overview, 88–93 TL (transport layer), 210
parallel-connection logic, 89–91 Token systems, 220–221
series-connection logic, 91–93 Tool failure, detecting, 204–207
Synchronous data transmission, 481 Torque sensors, 412
Synchronous indexing, 477–478 Total internal reflection, 141–142
Synthetic-aperture radar (SAR), 305–307 Transceivers, 99
System performance, improving, 359–360 Transducers, 411
System response time, 94 Transfer lines, 250
Systems application architecture Transforming growth factor (TGF), 355
(SAA), 269 Transistor DC switches, 84–85
Systems network architecture (SNA), 264 Translation, mechanism for, 255
Transmission Control Protocol/
T T Internet Protocol (TCP/IP), 216
Tactical level, CIM, 247 Transmission-type sensors, 329
Tactile sensors, 381–382, 412 Transmitters, 157
Talk sets, 176 Transponders, 277
Talkers, 480 Transport layer (TL), 210
Talkers/listeners, 480 Triac devices, 82–84
Tanaka, Hisashige, 418 Triangular ranging, 147
Tank level sensor, 109 Trinitron phosphors, 15
Target background, 79 Trio-stimulus LEDs, 285
Target duty cycles, 95 Triple-roll wrist, 426
Task lighting-lamps, 23–25 True color measuring instruments,
TCP/IP (Transmission Control 286–287
Protocol/Internet Protocol), 216 TTY (teletypewriters), 482
Teach pendants, 423–424 TV camera applications, 278
Telescope, 492 21XTL fiber-optic test set/talk set, 176
Teletypewriters (TTY), 482 Two active star couplers, 182
Televox, 418 Two-axis machine tool, 450
Temperature, 198, 496 Two-dimensional tasks, 396
Temperature sensors in process control Two-point calibration, 511
noncontact, 334–336 Two-step dual-pole limit switches, 150
overview, 329–330 Two-wire switches, 80
point-contact, in process 2260XF switchable dual laser test set,
manufacturing plants, 334 175
semiconductor absorption, 330–331 2260XFA laser test set, 175
semiconductor temperature 2285XQ fiber-optic power meter,
detector, 331–334 173–174
Terminations, fiber-optic, 170–172 Tyndahl, John, 141
Tesla, Nikola, 418
Test sets, dual laser, 175–179 U U
Testing UL (Underwriters Laboratories), 151
fiber optics, 172 Ultrasensitive sensors, for single-
light sources, 172–174 molecule detection, 321–323
TGF (transforming growth factor), 355 Ultrasonic dynamic vector stress
Thermally agitated electrons, 499 sensor (UDVSS), 312
Three-channel optical link, 160 Ultrasonic sensors
Three-wire series-connected circuits, end effector, 400
92–93 measuring dynamic changes in
Through-beam detection methods, 58 materials, 312–314
Through-beam sensors, 52–53, 55, nondestructive evaluation, 370–371
136–137 overview, 101