Page 630 - Sensors and Control Systems in Manufacturing

Index
RS-485 interface, 262 Sensitivity, SpectRx system (Cont.): 583
RTDs (resistance temperature signal-to-noise ratio, 506
detectors), 257 sources of noise, 498
Runtime phase, 399–400 spectroradiometer transmission, 497
R.U.R. (Rossum’s Universal Robots) throughput, 497
play, 417–418 Sensitivity adjustment potentiometers,
78
Sensor probes, fiber-optic. See Bundles,
S S fiber-optic
SAA (systems application Sensors
architecture), 269 overview, 1–4
Sabrie’s Index (SI), 491 types of, 43–48
SADT (structured analysis and design Sensor-to-target distance, 71
technique), 255–256 Sensory MEMS, 355–356
Safety monitoring equipment, 103–104 Sequencing genome, 7–8
Sales analysis, 540 Serial data transmission, 480–482
Sales budget, 524 Series-connection logic, 91–93
Sanger, Frederick, 7 Service robots, 435–437. See also Robots
Sanger method, 7 Servo systems, 49
SAR (synthetic-aperture radar), Servomotors, 303–305
305–307 Session layer (SL), 208–210
Satellite Sensor Data Service, 225–226 SHAPES (spatial high-accuracy
SAW (surface acoustic waves), 278 position-encoding sensor), 302
Scalable memory technologies, 9–10 Shared memory interfaces (SMIs), 224
Scanning electron microscope (SEM), Shielded inductive proximity sensors,
5, 110–111 73, 149
Scanning instability noise, 504 Shielded sensing coil, 67
Scheinman, Victor, 420 Short wave (germicidal) light, 23
Schmitt trigger, 293 Short-circuit protection, 87–88
Selectable functions, 272–273 Shot noise, 362
Self-contained photoelectric controls, Showering arc, 75, 79
52 SI (Sabrie’s Index), 491
Selling and administrative budget, Side by (lateral) approach, 71–72
525–526 Signal conditioning, 259
SEM (scanning electron microscope), Signal-to-noise ratio (SNR), 363, 495,
5, 110–111 506
Semiconductor absorption sensors, Silicon APDs, 364, 367
330–331 Silicon nano-crystals, 9–10
Semiconductor device fabrication, 334 Simplex fiber-optic cables, 185
Semiconductor displacement laser Simulation, 555–556
sensors, 119 Single output, 86
Semiconductor temperature detector, Single pole, double throw (SPDT)
331–334 relay, 52
Sensing principles, 282–283 Single reflex photoelectric sensor, 53
Sensitivity, SpectRx system Single-board computers
dark noise, 503–504 overview, 439–440
detector current, 498 personal computers as, 445–450
efficiency, 504–505 Single-molecule detection, 321–323
jitter noise, 504 Single-pole switch, 80
Johnson noise, 499–503 Singularities, 425–426
noise equivalent spectral radiance, Sinking (NPN) parallel sensor
505–506 arrangement, 90–91
object view spectral radiation, Site services, plant, 242
495–497 SL (session layer), 208–210
overview, 495 SLiK (Super-Low k) APDs, 367
photon noise, 498 SMA style connector, 171–172
power at detector, 497–498 Smart equipment, 556
quantization noise, 503 Smart highways, 1
scanning instability noise, 504 SMD (surface mount device), 23