Page 625 - Sensors and Control Systems in Manufacturing

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Multiple point calibrations, 512 Networking, manufacturing (Cont.):
Multiple-pole switch, 80 Satellite Sensor Data Service,
Multiple-ring digital communication 225–226
network, 221–223 tracking sensors, 194–196
Multiplexing, FFT spectrometry, 493 universal memory network,
Multipurpose advanced industrial 223–225.
robot installations, 435 (See also Machinery fault sensor
Multisensor-controlled robot assembly, networks)
412–417 9XT optical source driver, 172–173
19XT optical attenuator, 177
N N NIR (near infrared). See SpectRx NIR
NA (numerical aperture), 156 technology
Nano-capacitive positioning sensors, Nishimura, Makoto, 419
NL (network layer), 208–210
340–343 Nm (nanometers), 22
Nano-crystals, 9–10 NO (normally open) switches,
Nanometers (nm), 22 79–80
Nano-positioning capacitive Noise, sources of, 498
metrology sensors, 340–343 Noise current, 365–367
Nano-sensors, 9 Noise equivalent power (NEP), 363
Nanowatts power, 295 Noise equivalent spectral radiance
National Cancer Institute, 321 (NESR), 505–506
National Center for Manufacturing Noise factor, excess, 365–367
Sciences (NCMS), 9 Nominal sensing range, 68
National Electrical Manufacturers Noncontact sensors, 109, 334–336, 411
Association (NEMA), 151 Nondestructive evaluation sensors,
National Science Foundation (NSF), 9 370–371
NC. See Numerical control Nonembeddable sensors, 73
NC (normally closed) switches, 79–80 Nonferrous industries, 125–127
NCMS (National Center for Nonferrous targets, 69
Manufacturing Sciences), 9 Nonlinear multiple point calibrations,
Near infrared (NIR). See SpectRx NIR 513–515
technology Nonlinearity, 346
Near output, 140–141 Non-phosphor white LEDs, 29–33
Negative volume changes, 406 Nonshielded inductive proximity
NEMA (National Electrical sensors, 149
Manufacturers Association), 151 Normally closed (NC) switches,
NEP (noise equivalent power), 363 79–80
NESR (noise equivalent spectral Normally open (NO) switches,
radiance), 505–506 79–80
Network architectures for NPN (sinking) parallel sensor
manufacturing sensors, 373–375 arrangement, 90–91
Network layer (NL), 208–210 NPN transistor, 84
Network load, 215 NSF (National Science Foundation), 9
Network plans, 551 Numerical aperture (NA), 156
Network topologies, 374 Numerical control (NC)
Networking, manufacturing absolute control, 457–458
AbNET, 221–223 auxiliary commands, 466
computer communications, 207–211 computer numerical control system,
with electrooptic links, 179–184 466–468
flexible systems, number of geometric commands, 464–465
products in, 193 machining program, 452–457
manufacturing automation protocol, manufacturing procedure and
216–221 control, 451
network types motion commands, 465–466
Ethernet, 215–216 operation, 462–464
overview, 213 overview, 450–451
RS-232-based, 213–215 programming, 237
TCP/IP, 216 software, 458–462
overview, 191–193 Nyquist, H., 499