Page 627 - Sensors and Control Systems in Manufacturing

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Photoconductive sensors Plant level sensors and control systems
hybrids, 293 automated storage and retrieval
integrated circuits, 293 systems, 250
MCT detectors, 520 computer-aided engineering/
overview, 292–293 design/manufacturing, 250–251
visible light region, 295 in flexible manufacturing systems,
Photodarlingtons, 291–292 248–249
Photodetector, 133 in material handling, 250
Photodiodes, 189, 289–291, 295 microcomputers, 251–252
Photodyne 9XT optical source driver, overview, 248
172–173 Plant operations, 239–242
Photodyne 19XT optical attenuator, Plasma, 117
177 Plastic clad silica (PCS) fiber, 169
Photodyne 21XTL fiber-optic test set/ Plastic optical fiber, 142
talk set, 176 PLCs (programmable logic
Photodyne 2260XF switchable dual controllers), 74, 251, 446–448
laser test set, 175 PMM (product moment matrix), 301
Photodyne 2260XFA laser test set, 175 PMT (photomultiplier tube), 289–290,
Photodyne 2285XQ fiber-optic power 360
meter, 173–174 PNP (sourcing) parallel sensor
Photodyne 5200 series optical fault arrangement, 90
finders, 177–178 Point source, 491
Photodyne 8000XG fiber identifier, Point-to-point (PTP) controls, 453, 465
178–179 Point-to-point data link, 163
Photoelectric sensors Poissonian statistics, 366
automated guided vehicle system, Polarization, 148
140–141 Polarized reflex detection, 138–139
light-emitting diodes, 134–136 Polarized sensor, 53
manufacturing applications, 52–58 Police radar, 105
overview, 51, 133–134 Porphyrin, 320
polarized reflex detection, 138–139 Ports, 440
principles of operation, 51–52 Position, locating with robot vision,
proximity detection, 139–140 388–389
reflex photoelectric controls, Position encoder sensors in
137–138 manufacturing, 280–282
through-beam, 136–137 Positioning sensors, nano-capacitive,
Photoluminescence, semiconductor 340–343
temperature detector using, Position-sensitive detector (PSD), 119
331–334 Position-servo loop, 312
Photomultiplier tube (PMT), 289–290, Positive volume changes, 406
360 Potentiometer, 337
Photon noise, 498 Power at detector, 497–498
Photons, 113, 289, 498 Power line fault-detection systems,
Phototransistors, 291–292 375–376
Photovoltaic InSb detectors, 520 Power meters, 173–174
Physical distribution Power source, 422
CIM, 231 Power spectrum, 501
operations, 243–244 Power supply, LED, 22
overview, 242–243 PPPL (Princeton Plasma Physics
planning, 243 Laboratory), 189
Physical layer (PhL), 208–211 Predictive monitoring method
PID (proportional integral-differential) (PREMON), 314–315
control, 260 Presence, detecting with microwave
Piezoelectric crystals, 337–338 sensors, 98, 104–105
Pigment, 284 Present value, 544–547
Pin connectors, 88 Presentation, CIM environment,
PL (presentation layer), 209 267–269
Planck’s equation, 496 Presentation layer (PL), 209
Plant floor communications, 264–266 Pressure sensors, 337–340