Page 628 - Sensors and Control Systems in Manufacturing
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Primagraphics VME boards, 416  Programmable output, 86  Index   581
                          Primary, telescope, 491       Programmable Universal Machine for
                          Princeton Plasma Physics Laboratory   Assembly (PUMA), 420
                             (PPPL), 189                Programmer’s hierarchical interactive
                          Printed circuit boards (PCBs), 22  graphics standard (PHIGS), 271
                          Prisms, 353                   Programming faults, software, 203
                          Private service robots, 435–436  Project evaluation and review
                          Probe assembly, UDVSS, 313       technique (PERT), 551–554
                          Probe-mark inspection requirements,   Project management
                             Confocal Microscopy sensors, 113  CPM, 554
                          Problem processing systems, 254  PERT, 551–554
                          Process computer, 450           queuing analysis, 554–555
                          Process control sensors       Proportional integral-differential (PID)
                            for acceleration, 371–372      control, 260
                            capacitive proximity, 64    Proximity detection
                            diagram, 439                  methods, 59–61
                            inductive proximity, 63       photoelectric sensors, 139–140
                            liquid flow, 350–355        Proximity sensing mode, 144, 153
                            noncontact, 334–336         Proximity sensors, 61–62, 412. See also
                            overview, 328–330              Capacitive proximity sensors;
                            semiconductor absorption, 330–331  Inductive proximity sensors
                            semiconductor temperature   PSD (position-sensitive detector), 119
                               detector, 331–334        PTP (point-to-point) controls, 453, 465
                            temperature detectors using point-  Pulse phase-locked loop, 313
                               contact sensors, 334     Pulse Width Modulation (PWM), 22
                          Process development, 237      Pulse-width distortion, 159–160
                          Process signals, in decentralized   PUMA (Programmable Universal
                             manufacturing systems, 483–486  Machine for Assembly), 420
                          Procurement, 239              Pumping the laser, 116
                          Product budget, 524–525       Punched tape, 461, 466
                          Product definition exchange   Punch-through, 112
                             specification (PDES), 271  Pushbroom scan, 315
                          Product development, 236      PWM (Pulse Width Modulation), 22
                          Product lines analysis, 540   Pyrometers, 334–336
                          Product moment matrix (PMM), 301
                          Product shipping, 242              Q Q
                          Production management, 239–240  Quality
                          Production planning             corporate manufacturing strategy,
                            CIM, 231                         46
                            master production planning, 238  testing, 241
                            materials, 239                workpiece, 199
                            overview, 238               Quantization noise, 503
                            plant release, 239          Queuing (waiting line) analysis,
                            procurement, 239               554–555
                            resources, 239
                          Production process, 241
                          Production reliability, 46         R R
                          Productivity, 46              Radiance (L), 491, 492
                          Professional service robots, 435  Radio-frequency (RF) devices, 277
                          Profiling characterization systems,   Radio-frequency interference (RFI),
                             110–111                       74–75, 79
                          Profit analyses, 528–529, 540–541  Radiometers, 491, 509
                          Profit function, 549–550      Radiometric accuracy
                          Program flowchart, 442          calibration drift, 517–519
                          Program statements, 443         calibration source errors, 515–517
                          Programmable controller         channel spectrum error, 520–521
                             communication network, 180   detector nonlinearity errors, 520
                          Programmable logic controllers   intrinsic linearity, 519
                             (PLCs), 74, 251, 446–448     spectral aliasing error, 522
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