Page 133 - Six Sigma for electronics design and manufacturing
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Six Sigma for Electronics Design and Manufacturing
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                       The issues of calculating FTY have become important in light of the
                     increase in subcontracting the manufacturing of high-technology elec-
                     tronic products. Project teams and their leaders need accurate esti-
                     mates  of  new  product  yields  to  plan  and  budget  for  test  and  trou-
                     bleshooting  equipment  and  personnel.  In  addition,  management
                     needs to benchmark potential suppliers in terms of their manufactur-
                     ing  quality.  The  results  have  been  beneficial  in  several  categories,
                     and will be further highlighted in this chapter:
                       By rolling up the yields of its various product components and man-
                        ufacturing  operations,  the  total  product  yield  can  be  estimated.
                        Project teams are thus able to manage carefully where additional
                        resources are needed in terms of improving particular designs or
                        manufacturing  capabilities.  By  using  these  yield  estimates,  the
                        new product team can also increase the accuracy of the new prod-
                        uct cost estimates.
                       Design for manufacture (DFM) principles, as championed by manu-
                        facturing engineers, can be emphasized to the design team in order
                        to increase the FTY of new products, since a direct relationship can
                        be made between the two concepts.
                       FTY yield calculations can influence the focus of quality improve-
                        ment teams.
                       Yield calculation can clarify the best test strategy for reducing the
                        overall test and troubleshooting costs.
                       In this chapter, the issues of yield and test strategy will be exam-
                     ined in a hierarchy of steps:
                     1. Determining units of defects
                     2. Determining manufacturing yield on a single operation or a part
                        with multiple similar operations
                     3. Determining design or manufacturing yield of multiple parts with
                        multiple manufacturing operations or design specifications
                     4. Determining overall product testing strategy

                     4.1  Determining Units of Defects
                     The basic definition of a defect is one that is based on the Poisson dis-
                     tribution.  The  defect  rate,  or  defects  per  unit  (DPU),  is  calculated
                     based on defects, opportunities, and units. Defects are any deviation
                     of the product functions that causes customer dissatisfaction or non-
                     conformance  to  specifications.  Units  are  the  number  of  parts,  sub-
                     assemblies, assemblies, or systems that are inspected or tested. Op-
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