Page 153 - Six Sigma for electronics design and manufacturing
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Six Sigma for Electronics Design and Manufacturing
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                        low test coverage, under 90% yield of good PCB’s into the next test
                        cycle, will result in the need for a functional test of the PCB.
                     3. Functional test (FT). This type of test is used to eliminate design-
                        based as well as assembly defects. The latter occur when the set of
                        components being assembled meet their individual specifications
                        and are assembled correctly, but the assembled PCB does not meet
                        its  systems  specifications.  Functional  testers  use  the  PCBs  in  a
                        similar fashion to their intended use in the product. In its simplest
                        form, FT is called a box test, which consists of testing the PCBs in
                        a fully functional product.
                     4. The customer of PCB test is the next level of production. It usually
                        is  the  product  assembly  process,  where  the  PCBs  are  combined
                        with mechanical parts to form the product. The product might un-
                        dergo additional testing such as burn-in, product test, and system
                        test.
                          Product test occurs after the product has been assembled with
                        PCBs and other mechanical and input/output modules. Burn-in oc-
                        curs when the product is subjected to environmental stress condi-
                        tions, and then tested to see if there were any “infant mortality”
                        failures.  System  test  occurs  when  the  product  is  combined  with
                        other products with maximum-length cabling to form a system con-
                        figuration similar to those in customer sites.
                       The different types of PCB tests have different expectation of de-
                     fects  removal.  Test  engineers  usually  communicate  quality  through
                     using the PCB yields from each of the test methods mentioned above,
                     whereas  the  assembly  community  communicates  through  DPU  or
                     DPMO. The management sets enterprise goals at certain Cpk levels
                     or six sigma. Using the examples in this chapter, it was shown that
                     quality communications could be just as effective using any of these
                     common methods outlined above.
                       The PCB test strategy is formulated based on the lowest-cost alter-
                     native for removing defects, given the current quality level of the de-
                     sign and manufacturing process. To achieve a successful strategy, the
                     costs of each type of test as well as visual inspection should be known,
                     including nonrecurring costs such as test development and program-
                     ming, fixture design, and troubleshooting. A test strategy could be de-
                     veloped to provide the proper balance between investing in improving
                     the PCB assembly process capability versus performing test and trou-
                     bleshooting to remove defects generated in design and assembly. This
                     can be accomplished given the availability of alternative test method
                     costs, and having the defects and their sources quantified using meth-
                     ods outlined in this chapter.
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