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Six Sigma for Electronics Design and Manufacturing
                     46
                        production, a form of learning-curve-based improvements. This is-
                        sue of time improvements has long been recognized in the supply
                        chain, with commonly used incentives for cost reduction based on
                        time. The six sigma program maintains a constant ±1.5   allowable
                        average shift, which is an easier goal to manage irrespective of time.
                        It is the author’s opinion that it is better to manage quality with a
                        single number and concept, as opposed to a time-dependant stan-
                        dard. In addition, the reduced life cycle of electronic products, and
                        the emphasis on “doing it right the first time” should encourage the
                        supply chain to set a goal for first production quality and then main-
                        tain it. This might prove less costly in the long run.
                       The  choice  of  focusing  on  the  process  average  shift  correction  to
                        equal the specification nominal or reducing variability or both will
                        be discussed in greater detail together with the quality loss func-
                        tion (QLF), discussed in Chapter 6.
                       Cpk and six sigma can have different interpretations when consid-
                        ering attribute processes. These are processes in production, where
                        only the defect rates are determined and there are no applicable
                        specification limits. Examples of attribute processes are assemblies
                        such as printed circuit boards (PCBs) where rejects could be consid-
                        ered to be the result of implied specifications interacting with pro-
                        duction variability of materials and processes. In these cases, the
                        quality methodologies are centered around production defect rates
                        and not specifications, thereby clouding the relationships and nego-
                        tiations  between  design  and  manufacturing.  Different  levels  of
                        defect  rates  based  on  Cpk  levels  could  be  allowed  for  different
                        processes, resulting in an overall product defect goal setting and
                        test strategy based on these defects. Six sigma quality provides the
                        power of the single 3.4 PPM defect rate as a target for all processes.
                       A similar issue arises when using six sigma or Cpk for determining
                        total system or product quality. This is the case when several six
                        sigma designs and parts are assembled together into a system or
                        product. Six sigma practitioners handle this issue by using the con-
                        cept of rolled yield, that is, the total yield of the product based on
                        the individual yields of the parts. Those using the Cpk terminology
                        can continue to use Cpk throughout the product life cycle, assign-
                        ing different Cpk targets as the product is going through the design
                        and  manufacturing  phases.  More  discussions  on  this  subject  are
                        found in Chapter 10.
                     2.2.4  Setting the process capability index
                     Many companies are beginning to think about the process capability
                     index, be it six sigma or Cpk, as a good method for both design and
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