Page 1187 - The Mechatronics Handbook
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is missing, the step size at that point in the transfer function is doubled, effectively cutting the local
                                 resolution of the ADC in half. Therefore, ADC datasheets will specify if the ADC has no missing codes.
                                   Another way to capture the same information included in INL is a measurement called relative
                                 accuracy. Relative accuracy indicates how far away from the ideal the code transitions are (which is INL),
                                 but also includes how far any part of the transfer function, including quantization “staircase” error,
                                 deviates from ideal. In an ideal noiseless ADC, the worse case relative accuracy is always greater than the
                                 INL. However, if an ADC has some inherent noise and has noise (referred to a dither) added to the input,
                                 then the relative accuracy actually improves. The addition of noise to a quantizer tends to smooth the
                                 average transfer function that results in less of a “staircase” effect. This improvement in the transfer
                                 functions linearity comes at the expense of conversion errors caused by the added noise.

                                 Aperture Errors
                                 Aperture errors deal with the timing of the conversions themselves.  All  ADCs require some signal,
                                 generally a pulse train clock, to tell the ADC when to start a conversion. Inherently, some small amount of
                                 time will elapse when the ADC receives this convert signal and when the sample is held. This amount
                                 of time that lapses is called the aperture delay. Most ADCs have an aperture delay of just a few nanosec-
                                 onds. However, most measurement devices have some other circuitry in front of the  ADC, such as
                                 amplifiers, which have the effect of negating the aperture delay caused by the ADC. For example, if the
                                 ADC has a delay of 10 ns and the amplifier has a delay of 160 ns, the effective aperture delay of the
                                 system is -150 ns.
                                   Another important time specification is jitter. Jitter (or aperture jitter) measures the difference in the
                                 amount of time between each sample. If a signal is sampled at 1 million samples per second (1 MS/s),
                                 the expected period between each sample would be exactly 1 µs. The actual time between samples could
                                 vary from 1 µs by as much as a few picoseconds to a nanosecond from cycle to cycle. Jitter can be caused
                                 by the clock source, digital clock circuitry, or S/H circuitry. The most common effect of jitter is to add
                                 interference at frequencies very close to the signal of interest.

                                 Noise
                                 Noise limits the ADC resolution because an interfering waveform is present in the input signal as it is
                                 being converted. The most common source of noise in a signal is thermal noise. Thermal noise is caused
                                 by the random nature of electrical components. With higher temperatures and resistances in components,
                                 the thermal noise will increase. Other common sources of noise are electromagnetically coupled to nearby
                                 circuitry, such as logic circuits and clocks. Generally, noise is specified in volts peak-to-peak or rms, or
                                 LSBs rms or peak-to-peak.
                                   Quantization error, previously discussed, is sometimes referred to as quantization noise. Although
                                 quantization error is perfectly predictable with respect to the input signal, when a signal is fairly “busy”
                                 (meaning that each consecutive conversions do not result in many common bits of data) the quantization
                                 error becomes chaotic. When this occurs, the quantization error can be thought of as another source of
                                 random noise, whose statistical distribution is uniform from –0.5 to 0.5 LSB and whose standard deviation
                                 is 1/ 12  LSB. In spectral analysis, this is sometimes the dominant source of noise.
                                   Once noise reaches the ADC, there are ways to process the noise out of the signal, provided that the
                                 noise is an independent signal. One of the most common ways to decrease noise in a DC measurement
                                 is to acquire a number of points and average the values. If the noise is white random noise, which has
                                 equal energy density at all frequencies, averaging will reduce the amount of noise by the square root of
                                 the number of samples averaged. If the noise is interfering with a repetitive waveform, the noise can be
                                 reduced by measuring a number of waveforms, using a level trigger and then averaging the waveforms.
                                 Most digital oscilloscopes have waveform averaging.
                                   Most noise specifications for an ADC are for quiet, low-impedance signals. To preserve the noise
                                 performance of the ADC, the user must connect signals to the inputs with shielded cabling that keeps
                                 signals away from any electromagnetic interference.

                                 ©2002 CRC Press LLC
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