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46







                                                                                    A/D and D/A

                                                                                         Conversion






                                                              46.1  Introduction
                                                              46.2  Sampling
                                                              46.3  ADC Specifications
                                                                    Range  •  Resolution  •  Coding Convention  •  Linear
                                                                    Errors  •  Nonlinear Errors  •  Aperture Errors  •  Noise
                                                                    •  Dynamic Range  •  Types of ADCs  •  Flash  •  Successive-
                                                                    Approximation Register  •  Multistage
                                                                    •  Integrating  •  Sigma-Delta  •  Digital-to-Analog
                                                                    Converters  •  Updating
                                                              46.4  DAC Specifications
                                                                    Range  •  Resolution  •  Monotonicity  •  Settling Time and
                                                                    Slew Rate  •  Offset Error and Gain Error  •  Architecture
                                 Mike Tyler                         of DACs  •  Switching Network  •  Resistive Networks
                                 National Instruments, Inc.         •  Summing Amplifier

                                 46.1 Introduction

                                 As computers began to gain popularity, engineers and scientists realized that computers could become a
                                 powerful tool. However, almost all real-world phenomena (such as light, pressure, velocity, temperature,
                                 etc.) are analog signals, and computers, on the other hand, rely on digital signals. Therefore, many companies
                                 began to invest in advancements in analog-to-digital and digital-to-analog converters (ADC and DAC).
                                 These devices have become the keystone in every measurement device. This chapter will examine the ADC
                                 and DAC on a functional level as well as discuss important specifications of each.

                                 46.2 Sampling

                                 In order to convert an analog signal into a digital signal, the analog signal must first be sampled. Sampling
                                 involves converting one value of a signal at a particular interval of time. Generally, conversions happen
                                 uniformly in time. For example, a digitizing system may convert a signal every 5 µs, or sample at 200 kS/s.
                                 Although it is not necessary to uniformly sample a signal, doing so provides certain benefits that will be
                                 discussed later.
                                   A typical sampling circuit contains two major components: a track-and-hold (T/H) circuit and the ADC.
                                 Since the actual conversion in the ADC takes some amount of time, it is necessary to hold constant the
                                 value of the signal being converted. At the instance the sample is to be taken, the T/H holds the sample value
                                 even if the signal is still changing. Once the conversion has been completed, the T/H releases the value it is
                                 currently storing and is ready to track the next value.
                                   One aspect of sampling that cannot be avoided is that some information is thrown away, meaning that
                                 an analog waveform actually has an infinite number of samples and there is no way to capture every value.




                                 ©2002 CRC Press LLC
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