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Ultrasonic Bonding Systems and Technologies 49
2-51 Ingle, L., and Koontz, J., “Directly Bonded Interconnect Method and Adaptive
Feedback Bond Signature Analysis System,” Proc. 1993 Intl. Conf on Multichip
Modules, Denver, Colorado, Apr. 14–16, 1993, pp. 384–390.
2-52 Short, R., “Fine Pitch Wedge Bonding for High Density Packaging,” Proc. 1994 Intl.
Conf on Multichip Modules, Denver, Colorado, Apr. 13–15, 1994, pp. 50–55.
2-53 Anderson, 0. L., and Christianson, H., “Technique for Attaching Electrical Leads
to Semiconductors,” J. Appl. Phys., Vol. 28, 1957, pp. 923–924.
2-54 English, A. T., and Hokanson, J. L., “Studies of Bonding Mechanisms and Failure
Modes in Thermocompression Bonds of Gold Plated Leads to Ti-Au Metallized
Substrates,” 9th Annual Proc. IRPS, Las Vegas, Nevada, Mar. 31–April 2, 1971,
pp. 178–186.
2-55 Ahmed, N., and Svitak, J. J., “Characterization of Au-Au Thermocompression
(TC) Bonding,” Proc. Electronic Components Conf, Washington, D.C., May 1975,
pp. 52–63. Also In: Solid State Technology, Vol. 18, Nov. 1975, pp. 25–32.
2-56 Condra, L. W., Svitak, J. J., and Pense, A. W., “The High Temperature Deformation
Properties of Gold and Thermocompression Bonding,” IEEE Trans. on Parts, Hybrids
and Packaging, Vol. 11, Dec. 1975, pp. 290–296.
2-57 Jellison, J. L., “Kinetics of Thermocompression Bonding to Organic Contaminated
Gold Surfaces,”Proc. 26th Electronic Components Conf., San Francisco, California,
Apr. 26–28, 1976, pp. 92–97.
2-58 Antel, W. K., “Determining Thermocompression Bonding Parameters by a Friction
Technique,” Trans. Met. Soc. AIME, Vol. 236, Mar. 1966, pp. 392–396.
2-59 Smith, M., “Quality Assurance Issues Associated with Large-Wire Ultrasonic
Bonding,” ASTM Committee F-1.07, Jan. 26, 1995. Also see “Hybrids: Designing for
Maximum Yield in Power, Microwave and RF Devices.” Both available from Orthodyne
Electronics Corp, 2300 Main St., Irvine, California 92714.
2-60 Coucoulas, A., “Hot Work Ultrasonic Bonding? A Method of Facilitating Metal Flow
by Restoration Process,” Proc. 20th IEEE Electronic Components Conf, Washington,
D.C., May 1970, pp. 549–556.
2-61 Kessler, H. K., and Sher, A. H., “Microelectronics Interconnection Bonding with
Ribbon Wire,” NBS Technical Note 767, Apr. 1973, pp. 1–24.
2-62. Guidici, D. C., “Ribbon Wire vs. Round Wire Reliability for Hybrid Microcircuits,”
IEEE Trans. Parts, Hybrids and Packaging, Vol. PHP-11, June 1975, pp. 159–162.
2-63 Beck, D., “The Case for Ribbon Bonding of Large Packages to PCBs,” Surface Mount
Tech., Vol. 8, Apr. 1994, pp. 38–44.
2-64 Terman, F. E., Radio Engineers’ Handbook, McGraw-Hill, New York, 1943,
pp. 47–57.
2-65 Wong, G., and Oftebro, K., “Bond Test Methodologies for Large Aluminum
Ribbon,” Intl Symp. Microelectronics (IMAPS), San Jose, CA, Nov. 11–15, 2007,
pp. 933–940.
2-66 Knowlson, P. M., “Fundamentals of Parallel Gap Joining,” Microelectronics and
Reliability, Vol. 5, Pergamon Press, 1966, pp. 203–206.
2-67 Johnson, D. R., and Knutson, R. E., “Parallel Gap Welding to Thick Film
Metallization,” Proc. 26th Electronic Components Conf., San Francisco, California,
Apr. 26–28,1976, pp. 66–73.
2-68 Fendrock, J. J., and Hong, L. M., “Parallel Gap Welding to Very Thin Metallization
for High Temperature Microelectronic Interconnects,” IEEE Trans. on CHMT,
Vol. CHMT-13, June 1990, pp. 376–382.
2-69 International Technology Roadmap for Semiconductors. International Technology
Roadmap for Semiconductors. http://www.itrs.net/home.html
2-70 “Solder Ball Technology,” (multiple papers and authors), IBM J. Res. and Dev.,
Vol. 37, Sept. 1993, pp. 581–675. Also, ibid, Vol. 13, May 1969, pp. 226-284.
2-71 Kromann, G. B., Gerke, R. G., and Huang, W. W., “Hi-Density C4/CBGA
Interconnect Technology for a CMOS Microprocessor,” IEEE Trans. on CPMT-
Part B, Vol. 19, Feb. 1996, pp. 166–173.
2-72 Silverberg, G., “Single Point TAB (SPT): Versatile Tool for TAB Bonding,” 1987 Proc.
ISHM, Minn., MN, Sept. 28–30, 1987, pp. 449–456.
2-73 Larson, E. N., and Brock, M. J., “Development of a Single Point Gold Bump Process
for TAB Applications,” Proc. 1993 Intl. Conf on Multichip Modules, Denver, Colorado,
Apr. 14–16, 1993, pp. 391–397.