Page 95 - Building A Succesful Board-Test Strategy
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Figure 2-23 Varying component values within tolerance limits produces voltages that
fall into a scatter diagram. (From Proceedings of Nepcon West, 1998. Courtesy Agilent
Technologies.)
Figure 2-24 The scatter diagram if R1 or R3 fails. (From Proceedings of Nepcon
West, 1998. Courtesy Agilent Technologies.)
Figure 2-25 Looking at the scatter-diagram "shadow" if nodes are available only on
V1 and V2. (From Proceedings of Nepcon West, 1998. Courtesy Agilent Technologies.)
