Page 321 - Design for Six Sigma for Service (Six SIGMA Operational Methods)

Theory of Inventive Problem Solving (TRIZ) 289

What is deteriorated ? 28. Measurement accuracy 29. Manufacturing precision 30. Harmful action at object 31. Harmful effect caused by the 32. Ease of manufacture 33. Ease of operation 34. Ease of repair 36. Device complexity 37. Measurement or test complexity 38.

What should be Improved? 27. Reliability object 35. Adaptation 39. Productivity
19 24 32 15 32 2 19 22 2 35 26 10 26 35 35 2 19 17 20 19 19 35 28 2 28 35
21. Power
26 31 2 31 2 18 34 10 10 34 34 30 34 16 17 34
11 10 32 21 22 21 35 35 32 2 19 7 23 35 3 2 28 10
22. Waste of energy
35 35 2 2 22 1 15 23 29 35
10 29 16 34 35 10 33 22 10 1 15 34 32 28 2 35 15 10 35 10 35 18 35 10 28 35
23. Loss of substance
39 35 31 28 24 31 30 40 34 29 33 2 24 34 27 2 28 24 10 13 18 10 23
10 28 22 10 10 21 32 27 22 35 33 35 13 23
24. Loss of information
23 1 22 15
10 30 24 34 24 26 35 18 35 22 35 28 4 28 32 1 35 28 6 29 18 28 24 28
25. Waste of time
4 28 32 28 18 34 18 39 34 4 10 34 10 32 10 35 30
18 3 3 2 33 30 35 33 3 35 29 1 35 29 2 32 15 3 3 13 3 27 8 35 13 29
26. Quantity of substance
28 40 28 29 31 40 39 35 27 10 25 10 25 29 27 10 29 18 3 27
32 3 11 32 27 35 35 2 27 17 1 11 13 35 13 35 27 40 11 13 1 35
27. Reliability
11 23 1 2 40 40 26 40 8 24 1 28 27 29 38
5 11 28 24 3 33 6 35 1 13 1 32 13 35 27 35 26 24 28 2 10 34
28. Measurement accuracy
1 23 22 26 39 10 25 18 17 34 13 11 2 10 34 32 28 10 34 28 32
11 32 26 28 4 17 1 32 25 10 26 2 26 28 10 18
29. Manufacturing precision
1 10 36 34 26 35 23 18 18 23 32 39
27 24 28 33 26 28 24 35 2 25 35 10 35 11 22 19 23 19 33 3 22 31
30. Harmful action at object
2 40 23 26 10 18 2 28 39 2 22 31 29 40 29 40 34 13 24
31. Harmful effect caused by the 24 2 3 33 4 17 19 1 2 21 2 22 35
object 40 39 26 34 26 31 27 1 18 39
1 35 24 2 2 5 35 1 2 13 27 26 6 28 8 28 35 1
32. Ease of manufacture
12 18 13 16 11 9 15 1 11 1 1 10 28
17 27 25 13 1 32 2 25 2 5 12 26 15 34 32 25 1 34 15 1
33. Ease of operation
8 40 2 34 35 23 28 39 12 1 32 1 16 12 17 12 3 28
11 10 10 2 25 10 35 10 1 35 1 12 7 1 4 35 1 34 35 1 32
34. Ease of repair
1 16 13 2 16 11 10 26 15 16 13 11 7 13 10
35 13 35 5 1 35 11 1 13 15 34 1 16 15 29 1 27 34 35 28
35. Adaptation
8 24 10 32 31 31 1 16 7 4 37 28 35 6 37
13 35 2 26 26 24 22 19 19 1 27 26 27 1 13 29 15 15 10 15 1 12 17
36. Device complexity
1 10 34 32 29 40 1 13 926 24 28 37 37 28 24 28
37. Measurement or test 27 40 26 24 22 19 2 21 5 28 2 5 12 26 1 15 15 10 34 21 35 18
complexity 28 8 32 28 29 28 11 29 37 28
11 27 28 26 28 26 2 33 2 1 26 1 12 1 35 27 4 15 24 34 27 5 12
38. Degree of automation
32 10 34 18 23 13 34 3 13 1 35 10 25 35 26
1 35 1 10 32 1 22 35 35 22 35 28 1 28 1 32 1 35 12 17 35 18 5 12
39. Productivity
10 38 34 28 18 10 13 24 18 39 2 24 7 19 10 25 28 37 28 24 27 2 35 26