Page 41 - Engineered Interfaces in Fiber Reinforced Composites
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24                Engineered  interfaces in jiber reinforced composites

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                    Fig. 2.9. Variation of  the  position of the  1580 cm-’  peak with fiber strain  (a)  for a polyacrylonitrile
                     (PAN)-based HMS4 carbon fiber, and (b) for Thornel 50 carbon fiber. After Robinson et al. (1987).

                    stress transfer mechanisms  across the fiber-matrix  interface in the fiber fragmen-
                    tation  test  geometry  (Galiotis,  1993a).  The  variation  of  fiber  axial  strain  and
                    interface shear stress (IFSS) measured along the length of Kevlar 49 fiber embedded
                    in an epoxy matrix is shown in Fig. 2.10 for different levels of applied strain. The
                    IFSS  is  calculated  based  on  the  force  balance  between fiber  axial  direction  and
                    interface shear.

                    2.3.4. X-ray photoelectron spectroscopy

                      XPS,  also known  as electron  spectroscopy  for  chemical analysis (ESCA),  is  a
                    unique,  non-destructive analytical  technique  that  provides  information  regarding
                    the  chemical  nature  of  the  top  2-10  nm  of  the  solid  surface  with  outstanding
                    sensitivity and resolution.  In  XPS,  the  solid surfaces are  subjected to  a  beam  of
                    almost  monochromatic  X-ray  radiation  of  known  energy  in  a  high  vacuum
                    environment (4 x  10-9-1  x  lop8 Torr). Electrons are emitted from the inner orbital
                    with kinetic energies characteristic of the parent atoms. The intensities of the kinetic
                    energy are analyzed and the characteristic binding energies are used to determine the
                    chemical composition. The total absorbed X-ray photon energy, hv, is given by the
                    sum of the kinetic energy, EK, and the electron binding energy, EB

                        hv=EK+EB.                                                     (2.12)
                    Once the kinetic energy is measured with an electron spectrometer for a given X-ray
                    photon energy, the binding energy characteristic of the parent atoms can be directly
                    determined. The electron binding energy represents the work expended to remove an
                    electron from a core level of the inner orbital to the Fermi level in its removal from
                    the atom. Peaks in the plots of electron intensity versus binding energy correspond
                    to the core energy levels that are characteristic of a given element.
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