Page 44 - Engineered Interfaces in Fiber Reinforced Composites

Chapter 2. Characterization of interfaces 21

m-
9 :L 6
X
Y
4-
v)
C
3
0
U
2
I 1 I I
0 200 400 600 800 1000
Binding energy (eV)

- 0
25
- C
20
-
mGls
X
Y
v) -
2 10

Fig. 2.1 I. Spectra of (a) unsized and (b) sized T300 carbon fibers which are obtained from XPS. After
Cazeneuve et al. (1990).

compares the reactions in XPS, AES, SIMS and ISS, and the latter two techniques
will be discussed in the following sections. In AES, it is possible to focus an electron
beam laterally to identify features less than 0.5pm in diameter and into a monolayer
in thickness. In addition, by simultaneous use of analytical and sputter etching, it
may provide composition profiles. However, the AES electron beam is highly
concentrated with high flux density and beam energy, which can damage the
polymer surface causing pyrolysis during measurement. This makes it difficult to
employ AES technique on a thin film. In this regard, XPS is a more delicate
technique as the power required is an order of magnitude lower than in AES.