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30                Engineered interfaces in fiber reinforced composites
























                                               Atomic Mass Units (amu)

                     Fig. 2.14. A typical spectrum of a carbon fiber obtained from SIMS. After Denison et ai. (1988a, b).

                    techniques by  several years. There are two important features that make SIMS of
                    particular value (Castle and Watts,  1988):
                      (i) Hydrogen can be detected in the spectrum, a capability which is not possible in
                      the other methods.
                      (ii) Isotopes can be distinguished and thus the source of the material on the fiber
                      surface can be discovered by using tracers. Therefore, it is possible to distinguish
                      the  oxygen  derived  from  the  atmosphere  or matrix  material  from  the  oxygen
                      incorporated  during an oxidative treatment  of carbon fibers.

                    2.3.7. Ion scattering spectroscopy

                      In  ISS, a sample is bombarded  with gas ions such as helium or neon at a fixed
                    incident angle, as shown in Fig. 2.15, to obtain information about the atoms present
                    in  the  top  layer  of  the  surface.  The  high  sensitivity of  ISS  permits  detection  of
                    elements at the ppm level. The ISS spectrum normally consists of a single peak of
                    scattered  ion  intensity  at an energy loss that  is characteristic  of  the  mass  of  the
                    surface atom. Information regarding chemical bonding at the interface region can be
                    generated from the yield pattern  of scattered ions as a function of the primary ion
                    energy.
                      The combined ISSjSIMS is an extremely useful surface analytical technique that
                    can provide several types of data from the same surface. Both ISS and SIMS employ
                    ion beams, and thereby both methods can utilize the same ion source for the surface
                    probe, as schematically shown in Fig. 2.16. Addition of a specially designed ion lens
                    and quadruple mass spectrometer can make the whole system much more efficient.
                    The value of information  obtained from the combination  of  these two systems is
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