Page 268 - Fundamentals of Gas Shale Reservoirs
P. 268

248   GAS TRANSPORT PROCESSES IN SHALE

            cantilever spring and monitoring the cantilever deflection   mean pressure in the system, that is, between gas‐flux
            corresponding to tip‐surface forces, inventing AFM in the   reduction and mean pressure increase.
            process. Because the force between tip and surface is a
            function of gap width, the  AFM feedback system can                              b
              maintain a steady gap between tip and surface by vertical tip      kp (  m )  k D  1  p  ,    (11.1)
            displacement compensating for cantilever deflection.  This                        m
            technique allows topographic imaging of any material, either   where k(p ) is gas permeability at mean pressure (p ). The
                                                                         m
                                                                                                           m
            conductive or nonconductive.                         empirical parameters b and k  are the slope and intercept of
                                                                                        D
              The AFM scanner‐head system comprises a tip attached   the fitted line through the k(p ) versus 1/p  data. The inter-
                                                                                        m
            to the end of a cantilever, a chip holder, a laser source, a   cept k  is the intrinsic permeability or liquid permeability of
                                                                                                   m
                                                                     D
            mirror, a quadrant photodiode, and the controlling system   the sample, that is, 1/p  → 0  as  p  → ∞. The  Klinkenberg
                                                                                    m
                                                                                             m
            (Fig.  11.4). Applications of AFM measurements in shale‐  effect has been used to model gas flow in conventional gas
            reservoir studies are both intriguing and promising and   reservoirs  (with  pores  in  the  range  of  10s–100s µm)  and
            include detection of nanopores in shale samples,
            identification of different types of organic and inorganic
            grains in shale samples, and evaluation of elastic properties                                   210 nm
            at small scale (Javadpour et al., 2012). Using sharp tips a few
            nanometers in diameter, AFM can obtain nanoscale topog-
            raphy of various objects or surfaces. We used topographic
            images to study nanopores and grain boundaries in shale. An
            exemplary surface topographic image of a shale gas sample
            prepared by ion milling is presented in Figure 11.5.

            11.3  GAS FLOW IN MICROPORES AND
            NANOPORES

            The Darcy equation (1856) has been used for more than 150
            years to linearly relate fluid‐flow rate and pressure gradient
            across a porous system. The linearity of the Darcy equation
            makes it easy and practical to use in reservoir‐engineering                       2  m
            analysis and numerical reservoir simulations. Klinkenberg                                       86 nm
            (1941) showed experimentally that a linear relationship   FIGURE  11.5  Atomic force microscope (AFM) topography
            exists between Darcy permeability and the reciprocal of   image of shale sample. Darker areas reveal nanopores.


                                                      Quadrant photodiode
                                Detection laser            A  B
                                             Mirror

                                                           C  D
                                                                                             Phase
                                                                                 Electronics
                                                                                             Amplitude
                                                        Chip



                                    Tip
                       Sample surface         Cantilever

                                                           Feedback signal
                                  Piezoelectric
                                    scanner

            FIGURE 11.4  AFM scanner‐head system composed of tip attached to end of cantilever, chip holder, laser source, mirror, quadrant photo-
            diode, and controlling system. Piezoelectric scanner infinitesimally moves the sample up and down with high accuracy.
   263   264   265   266   267   268   269   270   271   272   273