Page 151 - Sami Franssila Introduction to Microfabrication
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130 Introduction to Microfabrication



                                                                           Nozzle



                               (a)                               Heater  Chamber  Nozzle guide
                                                                         Inlet channel



                                (b)                                        Manifold
            Figure 11.12 Spacer formation (a) conformal deposition
            over a step and (b) anisotropic etching to end point. For  Figure 11.14 Ink jet etching features: isotropically wet
            complete removal of top film, thickness to be etched is the  etched chamber, DRIE inlet channel, anisotropic TMAH
            sum of step height and top film thicknesses   manifold etch, anisotropic nozzle guide (spacer) etch.
                                                         Reproduced from Shin, S.J. et al. (2003), by permission
                                                         of IEEE

                                                         critical inlet channel is defined by DRIE, chamber
                                                         geometry is made hemispherical by isotropic wet etching
                                                         and anisotropic plasma etching is needed in making the
                                                         nozzle guides, which are similar to spacers from the
            Figure 11.13 Etching to end point leaves spacers, which,  fabrication point of view.
            if conductive, short neighbouring lines. If spacers are
            dielectric, they can form a permanent part of the device
                                                         11.9 EXERCISES
            Chapters 19, 25 and 26. Note that it is essential for  1. What would you use as plasma etch gases and etch
            spacer formation that etching is anisotropic; in isotropic  masks for etching the following materials:
            etching, sideways etching would remove the material at  – diamond
            the step edge.                                  – SiC
              If the bottom film is a conductor and top film is a  – GaN
            dielectric, the spacer can be left in place. However, if the  – GaAs
            bottom film is a dielectric and the top film is conductive,  – PbZrTiO 3
            then all the conductor lines etched in the top film will  – BCB (benzocyclo butadiene polymer)?
            be electrically connected with each other through the  2. Polysilicon etched depth in chlorine plasma is given
            conductive spacer at step edge (Figure 11.13).  in the table below. Determine the etch rate.

                                                                    Time (s)   Depth (nm)
            11.8 COMPARISON OF WET ETCHING,
            ANISOTROPIC WET ETCHING AND PLASMA                      20             50
            ETCHING                                                 40            185
                                                                    60            325
            In many applications, the choice of wet versus plasma
            etching is a question of convenience: certain equipment  80           455
            or etch bath is available or some suitable masking
            material is handy. When sloped etch profiles are  3. What is the activation energy of the etching of
            required, or when undercutting is needed, isotropic  <100> silicon in 20% TMAH?
            etching must be used. Isotropic wet etching of silicon
                                                                          ◦
            can be done at fairly high rates – microns per minute or  Temperature ( C)  Rate (µm/hr)
            even tens of microns per minute. Through-wafer etching
            is done either by anisotropic wet etching or by DRIE.  60                 29
            The ink jet example of Figure 11.14 shows how different  70               36
            etch techniques are utilized in one device: manifold  80                  62
            etching is done by TMAH anisotropic wet etching,   90                     87
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