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                   344                       MEMS and Microstructures in Aerospace Applications


                       Electrostatic discharge (ESD) or electrical overstress (EOS) occurs when a
                   device is improperly handled. A human body routinely develops an electric potential
                   in excess of 1000 V. Upon contact with an electronic device, this build-up will
                   discharge, creating a large potential difference across the device. The effect is
                   known to have catastrophic effects in circuits and could have similar effects on
                   MEMS devices where ESD may cause attractions or shifts. While the deleterious
                   effects of ESD onMEMS structures arejust beginningto be published, 34,35 one should
                   assume that certain electrostatically actuated devices will be susceptible to ESD
                   damage.


                   15.6 CONCLUSION
                   For MEMS devices to be properly operated in space, materials and hardware
                   reliability is essential. MEMS reliability can be achieved by applying conventional
                   reliability practices for electronics while taking space environmental effects into
                   consideration. For a space application, reliability practices are validated as require-
                   ments and reflected in a mission design and review cycle with key milestones such
                   as preliminary design review (PDR) and critical design review (CDR) which are
                   covered in the next chapter on quality assurance.
                       The performance of MEMS devices is strongly affected by environmental
                   factors and the effect may vary according to specific MEMS applications. The
                   environmental impact occurs during all mission phases. Generally, the impact is
                   more severe under the preoperational environments than more benign operational
                   and maintenance environments. Under the worst scenario, the synergy of environ-
                   mental factors may cause detrimental effects and render the devices useless.
                       To warrant a successful mission, MEMS designers need to pay attention to
                   prevent potential failure mechanisms in space. MEMS devices are susceptible to
                   corona and high breakdown voltage. Lessons learned from numerous space mission
                   failures provide important information for future MEMS design. During MEMS
                   design and operation, additional effort is required to mitigate failure mechanisms
                   related to materials and structures.
                       The study of POF, like any other scientific discipline, requires testing to
                   validate hypotheses and gather data on failure mechanisms. A significant amount
                   of research can be conducted on the ground, but some amount of space-based
                   research is likely to be necessary. POF research could make extensive use of low-
                   cost ‘‘time-in-space’’ facilities, such as Shuttle deployed free-flying spacecraft,
                   balloon demonstrations and sounding rockets. Inexpensive long-duration missions
                   might allow data to be gathered on actual performance in space, with components
                   being returned to Earth for analysis.


                   REFERENCES
                    1. IEEE  Standard  Computer  Dictionary:  A  Compilation  of  IEEE  Standard
                       Computer Glossaries. Institute of Electrical and Electronics Engineers, New York,
                       NY, 1990.




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