Page 22 - Mechanical design of microresonators _ modeling and applications
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                                            Design at Resonance of Mechanical Microsystems

                                                   Design at Resonance of Mechanical Microsystems  21
                                Intrinsic losses in the resonator material are important mechanisms
                              accounting for energy dissipation. In a recent paper, Czaplewski et al. 17
                              analyzed the loss mechanisms in tetrahedral amorphous carbon (taC)
                              and concluded that paramount in extrinsic internal dissipation is the
                              defect motion, which is generated by structural reconfiguration through
                              atomic motion between equilibrium or metastable states. The nomen-
                              clature  and  model of the anelastic or standard solid are  utilized to
                                                                        18
                              quantify the material losses; see Freudenthal.  The model basis is the
                              incompressible viscoelastic equation (also known as Zener’s model, see
                                                19
                              Cleland and Roukes ), which describes such a behavior, namely, where
                                                     dı           dİ
                                                ı + IJ    = E(İ + IJ   )                   (1.58)
                                                    1  dt        2  dt

                              where ı = normal stress
                                    İ = normal strain
                                    IJ  = stress-relaxation time
                                     1
                                    IJ = strain retardation time
                                     2
                              This material model captures both the stress relaxation phenomenon
                              (which means decrease of the stress in a component when constant
                              strain is  applied)  and the strain retardation  phenomenon,  or creep
                              (which implies the increase of strain under the application of a constant
                                                       19
                              stress). Cleland and Roukes  suggested the following quality factor as
                              being responsible for intrinsic losses:
                                                  1  =    ȦIJ   E íE
                                                                 d
                                                 Q          2 2  E                       (1.59)
                                                  m    1+ Ȧ IJ
                              where E d  is the dynamic (or unrelaxed) Young’s modulus, which is ex-
                              perimentally determined by means of rapidly applying the test load,
                              and ı is an aggregate relaxation time, which is calculated as

                                                       IJ = IJ IJ                           (1.60)
                                                            1 2
                                Other factors accounting for energy dissipation in microresonators
                              include losses through thin layers (surface losses), losses connected to
                              the shape of the mechanical components, generated through phonon-
                              phonon scattering, Nyquist-Johnson noise produced by electronic
                              circuitry, transduction losses, adsorption-desorption processes from
                              residual gases, environmental thermal drifts, or material defects such
                              as those encountered at grain boundaries. By adding the losses that
                              have  been discussed in this section, the overall quality factor  is
                              calculated as




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