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1.4 Integrated Systems with LDs and Micromechanics  23



                                                                    Laser diode
                                                                      (LD1)




                                                   Laser diode (LD2)
                                                GaAs          Microcantilever

                                      Fig. 1.29. Photograph of central part of a resonant sensor


                                                                      Mirror


                                           Photodiode
                                                                         0.6 mm
                                                        U-shaped LD

                                            Microlens
                                                                             Gap


                                                        Scale       Pitch L
                            Fig. 1.30. Schematic drawing of an optical encoder consisting of a photodiode (PD),
                            a U-shaped laser diode (LD), and microlenses [1.68]



                            A microcantilever (MC), LD, and a photodiode (PD) have been fabricated on
                            the surface of a GaAs substrate, as shown in Fig. 1.29. Possible applications are
                            resonant frequency detection sensors such as accelerometers, and mechanical
                            filters such as those for synchronizingsignal detection, which are described in
                            Sect. 2.4.2 [1.17].


                            1.4.3 Optical Encoder
                            Elimination of bulky optical components, includinga beamsplitter, a reflection
                            mirror, a photodiode, and a collimatinglens, will lead to adjustment-free,
                            cost-effective small optical devices. An optical encoder consistingof a PD, a
                            U-shaped LD, and microlenses, as shown in Figs. 1.30 and 1.31, was proposed.
                            It has been evaluated to measure the relative displacement between a scale
                            grating and the encoder itself with a resolution of 0.01 µm [1.68].
                               When the encoder moves a distance x relative to the grating, the phase
                            shift of the light refracted at the grating of pitch Λ is + 2πx/Λ for one etched
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