Page 317 - A Practical Guide from Design Planning to Manufacturing
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         Photoresist  Photoresist  Photoresist  Photoresist  Photoresist  Photoresist



                Wafer                 Wafer                 Wafer
             Isotropic etch       Anisotropic etch      Preferential etch
        Figure 9-17 Etch isotropy.



        SiO on top of silicon. However, a chemical reaction will proceed on any
            2
        exposed surface and makes no distinction between directions. Wet etches
        are isotropic, cutting horizontally and vertically at equal rates. Because
        of this, wet etches are not used for creating features sizes below about
        2 µm. Wet etches are still useful since the upper levels of even modern
        processes may have features of this size or larger. Also, they are used to
        quickly remove an entire layer that was added to aid in processing. A wet
        etch of hydrogen peroxide (H O ) mixed with sulfuric acid (H SO ) is
                                    2
                                                                  2
                                                                     4
                                      2
        commonly used to strip photoresist after etching the layer beneath. Wet
        etches are also often used between processing steps to clean wafers of par-
        ticles or chemical contaminants before the next processing step.
          To etch feature sizes below 2 µm dry etches are required. Rather than
        using liquid solutions, dry etches occur in vacuum chambers under low
        pressure. The three basic types of dry etches are shown in Fig. 9-18.
          Sputter etching (also called ion beam etching or ion milling) reverses
        the process of sputter deposition. When using sputtering to deposit a
        layer of material, argon ions are accelerated at a target, knocking atoms
        free to be deposited on the wafer. In sputter etching, the wafer is the
        target of the accelerated ions and material is gradually etched off its sur-
        face by the physical impact of the accelerated ions. This is a purely
        physical process, like atomic level sandblasting. This creates etches,
        which are extremely anisotropic, since the ions are accelerated vertically
        into the wafer, but not at all selective. The rain of ions will etch almost




                                 Plasma              Plasma
          E-field  Ar +  E-field  Radical+        E-field  Radical+  E-field



              Wafer               Wafer              Wafer

           Sputter etching     Plasma etching   Reactive ion etching
        Figure 9-18 Dry etches.
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