Page 363 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
P. 363

MEASUREMENT   SETUP    343









                                                           fref  x  f  sample







       Figure  11.5  Block  diagram  of dual  reference  and  sample  analogue mixing  circuit


  sensor  and reference oscillators,  producing  some  degree  of baseline  offset.  Although the
  mixing  circuit technique  will  significantly reduce  the  effects  of  common  mode  interfer-
  ence,  there  is  always  the  possibility  that  interference  could  compound  and,  therefore,
  increase  measurement errors.
    Another  option  is  to  use  an  environmentally  isolated  precision  reference  oscillator.
  As  the  frequency  from  this  protected  reference  oscillator  will  remain  fixed,  the  mixed
  frequencies  from  the reference and  indicator  sensor  oscillator  will not  contain  frequency
  contributions  from  any interfering source (Crabb and  Lewis  1973).



  11.8  MEASUREMENT SETUP

  The  vector  network  analyser  and  associated  calibration  techniques  make  it  possible  to
  accurately  measure the  transmission  parameters  of  the  devices  under test.  The  measure-
  ment  schematic  is  shown in Figure  11.6.  The  network analyser consists  of a  synthesized
  sweeper  (10 MHz-40 GHz), test  setup (45 MHz-40 GHz), HP8510B  network analyser,
  and  a  display  processor  (Subramanian  1998;  Piscotty  1998).  The  sweeper  provides  the
  stimulus and the test setup provides  signal separation. The display panel  of the  HP8510B
  is  used  to  define  and  conduct  various measurements.  The  system bus  is  instrumental  in
  controlling  various  other  instruments. The  device  to  be  tested  is  connected  between  the
  test  Port  1 and  Port  2.  The  point  at  which  the  device  is  connected  to  the  test  setup  is
  called  the  reference  plane.  All  measurements  are  made  with  respect  to  this  reference
  plane.  The  measurements  are  expressed  in  terms of  the  scattering  parameters  referred to
  as S parameters  (Subramanian 1998).  These  describe  the  signal flow within the network.
    S  parameters are defined  as ratios and are represented by S inn/ out, where the subscripts in
  and  out refer to  the  input  and  output  signal, respectively.  Figure  11.7  shows the energy
  flow  in  a  two-port  network.  It  can  be  shown  that  (see  HP  8510B  Network Analyser
  Manual  1987)
                   b 1 =  a 1S 11 =  a 2 S 12  and  b 2 = a 1 S 21 = a 2S 22  (11–2)

  where  S 11  is b\la\  and  5 21  is  b 2la 1  when a 2  is  zero;  5 12  is b\la 2  and  522 is  b 2/a 2  when
  a\  is  zero.  S\\  and  5 21  (5i2 and  522) are  the  reflection and  transmission  coefficients  for
  Port  1(2), respectively.
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