Page 375 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
P. 375

DEPOSITION  OF WAVEGUIDE  LAYER   355

     Some  of  the  other  problems  associated  with  PECVD  (TEOS)  are  that  (7) quality
  plasma-enhanced chemical vapour-deposited  tetraethoxysilane (PETEOS)  SiO 2 films are
  difficult  to achieve at temperatures below 250 °C (Alaonso et al.  1992; Itani and Fukuyama
  1997)  and  (2)  TEOS  has  a  low  vapour  pressure  of  approximately  2  mTorr  (25 °C  and
  1  atm),  which  necessitates  the  heating  of  all  delivery  lines  and  chamber  surfaces  to
  prevent  TEOS  condensation  and  prevents  gas  metering  with  conventional  mass-flow
  controllers,  thus rendering the resulting process  prohibitively expensive (Ballantine et al.
  1997).  Conventional  mass-flow  controllers,  on  the  other  hand,  easily  meter  silane  gas,
  but  great  care  must be  used because  silane  is  a toxic and pyrophoric gas  and constitutes
  an  explosion  hazard  at  high  SiFU  concentrations.  These  limitations  add  to  the  cost  and
  complexity  of  TEOS  and  silane-based  silicon  deposition  equipment.  To  achieve  a  low
  temperature,  good  quality  oxide,  and  for  the  circumvention of  the  safety  issues  associ-
  ated  with  silane-based  oxides  and  the  manufacturing complexities  inherent with  TEOS,
  an  alternative precursor  needs  to be employed.
     Potential organo-silicon precursors are compiled and their critical physical and chemical
  properties  are  tabulated  for  comparison  with  the  properties  of  silane  and  TEOS.  Of  all
  the  precursors  listed  in  Table  12.1,  tetramethylsilane  (TMS)  can  be  chosen  as  the  best
  precursor  for  the current low-temperature application for  several reasons.
     TMS  is  known  to  be  nontoxic  and  nonpyrophoric,  and  its  high  vapour  pressure
  (580  mTorr) allows for the use of conventional mass-flow  controllers at room temperature.

   Table  12.1  Tabulation  of  relevant  parameters  for  feasible  PECVD  precursors  (Gangadharan
   1999)
   Precursor  Silane    TEOS      TMS        MS       TMCTS       LTO-410,
                                                                  DBS

   Chemical   Silane    Tetraethoxy  Tetramethyl Methyl  1,3,5,7  Tetra  Diethyl-
    Name                  silane    silane     silane  methylcyclo  silane
                                                       tetrasiloxane
   Formula    SiH 4     Si(C 2H 5O) 4  Si(CH 3) 4  CH 3SiH 3  C 4H 160 4Si 4  SiH 2(C 2H 5) 2
   MW         32        208.3     88.2       46       240.5        88.2
   State  @   Gas       Liquid    Liquid     Gas      Liquid      Liquid
    20 °C
   Best Assay  **       >99.99    99.90               99.90        > 99.70

   VP@20°C   Gas        1.5       589                 6           207
    (mTorr)
   Use  stand.  Yes     No        Yes        Yes     Not  sure    Yes
    MFC
   Stability  Unstable  Stable    Stable     **       **          Stable
   Flammable  Yes       Yes       Yes        Yes      Yes         Yes
   Pyrophoric  Yes      No                   **      Not  sure    **
                                             **       **          **
   Toxicity  Toxic  (0.5)  Nontoxic
    (ppm)                (100)
   ** Values  not known.
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