Page 377 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
P. 377

DEPOSITION  OF WAVEGUIDE LAYER     357

                  Table  12.2  Main  steps  involved in the  etching  process
         Step  Description
         (a)   Exposure of  photoresist  metallised  wafer with positive  IDT  mask  plate.
         (b)   Develop  photoresist  patterned  structures.
         (c)   Removal  of unwanted metallisation  layer via chemical  wet-etching.
         (d)   Removal  of  photoresist  layer.


                  Table  12.3  Main  steps  involved in  the  lift-off  process
         Step  Description
         (a)   Exposure of photoresist  bare  wafer  with negative IDT  mask  plate.
         (b)   Develop  photoresist  and formation  of  the characteristic lip.
         (c)   Deposition  of  metal  layer onto the  wafer.
         (d)   Removal  of  unwanted metallisation  via  acetone  rinse.


  Table  12.4  Summary of the  main advantages  and disadvantages of the etching and  lift-off  proce-
  dures
                                Etching procedure
  Advantages:                            Disadvantages:
  Simple  and reproducible              Process  parameters  must be characterised
  Good  resolution achievable           Compatibility of  chemical  etchants with
                                          substrates
  Fast  realisation                     Loss  of feature resolution  due  to overetching,
                                          tendency  to undercut
  Ideal  for  small batch processing    Susceptible  to  electrical  shorts
                                 Lift-  off  procedu re
  Advantages:                           Disadvantages:
  Capable  of  higher  resolution       Extreme  care  in handling  before  metallisation
  Occurrence  of electrical  shorts  minimised  Intimate-contact  photolithography  required  to
                                          achieve  vertical  sidewalls  on  patterned
                                          photoresist  structures
  Photolithography  process  is  independent of
    pattern  resolution
  Etchants  not required                Poor  'lift-off  possible  because  of  incorrect
                                          formation  of  characteristic  'lip'
  Ability  to reprocess  patterned  photoresist
    structures before  metal  layer  deposition


  At  the  end  of  this  preclean,  the  plasma  remains  and  TMS  vapour  is  introduced.  It  is
  metered  using a conventional  10 cubic  centimeter  per  second  (cc/s) mass-flow controller
  (MFC) to  the desired  volumetric flow rate.  The oxide  deposition  begins  at this point and
  is  continued  for  a  predetermined  time  to  achieve  an  oxide  film  of  the  desired  thickness.
  Following  the  deposition,  the  TMS  gas  is  turned off, but  the O 2-He plasma  is kept  on
   372   373   374   375   376   377   378   379   380   381   382