Page 424 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
P. 424

404    MEMS-IDT MICROSENSORS


                     1                  c                 2
                            V
                                                   ^
                            r-          ^          ^
                               s u>r          > k  S 22
                       _   ^            ^
                                               — ^



                      Figure  14.5  Signal flow in a two-port  network

   the device  is connected  to the test  set is called  the  reference  plane. All measurements  are
   made with reference  to this plane.  The measurements  are expressed in terms of  scattering
   parameters  referred  to  as  5  parameters.  These  describe  the  signal  flow  (Figure  14.5)
   within  the  network.
     5  parameters  are defined  as ratios  and are represented  by  Sin/out,  where the subscripts
   in  and  out  represent  the  input  and  output  signals,  respectively.  Figure  14.5  shows  the
   energy flow in a two-port network. It can  be  shown that

                    b 1 = a 1S 11 +  a 2S 12  and  b 2  = a 1S 21 +  a 2S 22  (14.1)


   and,  therefore,

    S 11 = b 1/a 1, S 21 =  b 2/a 1  when a 2 = 0;  S 12  = b 1 /a 2 , S 22 =  b 2/a 2  when a 1 = 0.
                                                                        (14.2)
   where  S 11  and  S 21  (S 12  and  S 22)  are  the  reflection  and  transmission  coefficients  for
   Port  1(2),  respectively.



   14.4.2  Calibration Procedure

  Calibration  of  any  measurement  system  is  essential  in  order  to  improve  the  accuracy
  of  the  system.  However,  accuracy  is  reduced  because  errors,  which  may  be  random  or
  systematic,  exist  in all types  of measurements.  Systematic  errors are the  most significant
  source  of  measurement uncertainty. These  errors  are  repeatable  and  can  be  measured  by
  the  network analyser.  Correction  terms can  then be computed from  these  measurements.
  This  process  is known as  calibration. Random errors  are  not  repeatable  and  are caused
  by variations due to noise, temperature, and other environmental factors that surround the
  measurement  system.
     A series of known standards are connected to the system during calibration. The system-
  atic effects are determined  as the difference between the measured and the known response
  of  the  standards. These  errors  can  be  mathematically related  by  solving the  signal-flow
  graph.  The  frequency  response  is  the  vector  sum  of  all  test  setup  variations  in  magni-
  tude and phase with frequency.  This  is inclusive of signal-separation devices,  test  cables,
  and  adapters.  The  mathematical  process  of  removing  systematic  errors  is  called  error
  correction.  Ideally,  with  perfectly  known standards,  these  errors  should  be  completely
  characterised.  The  measurement system  is  calibrated  using  the  full  two-port calibration
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