Page 136 - Wire Bonding in Microelectronics
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114    Cha pte r  F o u r


              unless the wire diameter is less than or equal to 25 µm. See Levine
              [4-45] for a concise discussion of fine pitch and ribbon testing.
                 The greatest use of the shear test on wedge-wedge bonds takes
              place on large-diameter Al wire wedge bonds, such as are used in
              power devices. These are usually made with parallel, V-grooved tools
              and stand relatively high. Such bonds can be successfully evaluated
              with a shear tester. For example, if a 250 µm (10 mil) diameter Al wire
              is deformed 20% (at the interface) and has a foot length of 750 µm
              (30 mil), then the shear force will be approximately 1.6 kgf (3.5 lbf) if
              the interface was fully welded. ∗  A well-bonded Al wedge bond from
              large wire [diameter ≥ 100 µm (≥4 mil)] on a power device should
              yield a shear force value on the order of 2 to 4 times the pull force
              value (depending on the length of the bond), thus greatly increasing
              the sensitivity for bonding machine setup purposes. A shear strength
              value [see Eqs. (4-6) and (4-6a) in Sec. 4.3.5] can be defined for large
              wedge bonds by substituting the wedge-pad contact area (bond
              length times width) in place of the ball area, as in Eq. (4-9). This will
              make it possible to compare bonding quality between different-sized
              wires, foot lengths, or possibly different metallurgies.
                                              SF 
                                SS (wedge bond)  =   LW         (4-9)
                                              ×

              where SF is in gf, W is the interface width, and L is the bond length.
              Both are normally in mils, but as in Eq. (4-6) could equally well be in SI
              units. In the example above, the SS = 4.4 gf/mil  (0.07 mN/µm ). This
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              is one random example but real experimental data should be higher.
                 An interesting testing change has occurred now that ball-bond
              pitch has decreased below 50 µm. First, the shear test is increasingly
              hard to apply due to interference with adjacent bonds.  Second, the
              bonded area will be reduced to the point that a bond pull test will
              adequately evaluate the strength of a ball bond. A pull test criterion
              can be based on 75% welded area (percentage of intermetallics) of the
              ball. When this area becomes equivalent to the wire diameter, then
              the pull test will adequately evaluate the ball-bond strength, and
              that test can be substituted for the shear test. (We note here that
              the adhesion of the bond pad metallization to the substrate can fur-
              ther lower the pull-failure force and may result in lifted metallization—
              a condition that many current specifications reject. The need for such
              changed pull criteria/specifications will be discussed in Chap. 9.)
                 Ribbon bonds with a height of 12 µm (∼0.5 mil) or higher can also
              be successfully tested with a shear tester. Optimum shear test values
              for both ribbon and large-diameter wire can be obtained from the
              curves of Fig. 4-17 by correcting for the rectangular bonded area.

              ∗ Based on 700 kg/cm  (10,000 psi) shear force of annealed Al and a wire-breaking
                             2
              load of ~500 g (1.1 lb).
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