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W ir e Bond Testing   115


                 Shear testing has been used for years to test the integrity of TAB
              bumps at the wafer level. It was also used to measure the strength of
              the bonding between the TAB lead and the bump as well as the lead
              buckling force [4-46]. Typically, such tests were performed with a wire-
              bond ball-shear tester. The shear test is universally used to determine
              the strength of solder balls on chips for flip-chip attachment.

              4.3.11 Ball-Shear Test Standardization
              The ball-shear test is used in essentially all major semiconductor
              assembly facilities around the world to control ball-bond production
              for all but the finest pitch. There are two published standards on its
              usage, as well as many internal company manufacturing specifica-
              tions. The first standard specification was published by ASTM in 1990.
              It is ASTM F 1269, and was updated in 2006. It is test methods for
              shear testing of ball bonds. This test was originally documented by a
              round robin involving six cooperating laboratories [4-47]. The EIA
              JEDEC committee JC-14.1 has issued a shear test standard which is
              available on the Internet as a JEDEC (commercial) standard (www.
              jedec.org/download/search/22b116.pdf): Wire Bond Shear Test
              Method, EIA/JESD22-B116. This test contains recommended shear
              test values, see Fig. 4-23. It is now called out in MIL-STD. 883G/H.


                                  Minimum shear values
                  50              75             100            125 µm
            110
            100      Minimum shear values for
             90     Au-Al (top) and monometallic
                         bonds (bottom)
             80         Preferred min individual
          Shear strength (gf)  60  shear [5.5 g/mil  (84 MPa)]
             70
                                   2
                        for Au-Al bond reliability
             50
             40
             30
             20
             10
             0
              1.75 2.0 2.25 2.5 2.75 3.0 3.25 3.5 3.75 4.0 4.25 4.5 4.75 5.0 5.25
                                 Ball bond diameter (mils)
         FIGURE 4-23  Modifi ed minimum recommended ball-shear test values given in the
         EIA/JESD22-B116 document. The recommendation would be improved if the top
         curve at 84 MPa (5.5 g/mil ) was the minimum shear reading for Au-Al bonds.
                             2
         However, monometallic bonds should be reliable on the lower line. (This Document
         is on the Web. It may be subject to revision.)
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