Page 113 - An Introduction to Microelectromechanical Systems Engineering
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92                      MEM Structures and Systems in Industrial and Automotive Applications

                               Insulator


                       N-type epitaxial layer                          Deposit insulator
                          P-type substrate
                            Silicon nitride


                          P-type diffusions                            Diffuse piezoresistors



                                 Metal
                                                                       Deposit and
                                                                       pattern metal





                                                                       Electrochemical
                                                                       etch of backside
                                                                       cavity



                                                                       Anodic bond
                                                                       of glass
                                  Glass



                 Figure 4.9  Fabrication steps for a piezoresistive, gauge, or differential bulk micromachined
                 pressure sensor.


                                                Metallization

                               N-type layer                   Diffused piezoresistor





                               Fusion
                               bond line

                                     Inward sloping
                                     {111} planes
                                                 P-type substrate
                 Figure 4.10  A miniature silicon-fusion-bonded absolute pressure sensor. (Courtesy of: GE
                 NovaSensor of Fremont, California.)




                 techniques place certain restrictions on the device and process design. For example,
                 one scheme uses laser trimming of resistors with near-zero TCR to correct first-
                 order errors, but this scheme requires that the average doping concentration of the
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