Page 238 - Fiber Fracture
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STRENGTH AND FRACTURE OF METALLIC FILAMENTS                         223

             had  on both sides an additional layer of  0.05 pm Ti. Micro-lithography was used to
             pattern the tensile samples with a gauge section of 200 pm width and 600 wm length.
             The  silicon waver was  removed by  etching for  4 h  at  100°C. This  also determined
             the final annealing state. The average grain size was then found to be 0.98  pm.  His
             tensile specimens have therefore only one or a few grains through the thickness. The
             extremely delicate fatigue tests were performed with specially designed equipment in
             the load-controlled tension-tension  mode with a frequency of  1/15 Hz Read (1998b).
             The dispersion on the fatigue life is much larger than for the foils of Hong and Weil. but
             of the same order (1  decade) as for measurements on wires and the other foils shown in
             Fig. 39 (see also Table 6). The fatigue resistance for these micro-specimens is quite high
             and comparable to as-drawn wires and eletrodeposited films. Previous measurements on
             similar AI  foils (Read and Dally,  1995), however, gave fatigue lives that were 2 to 3
             decades below those of AI sheets (Forrest, 1966). From his TEM studies Read confirms
             the observation of Hong and Weil that cyclic deformation does not generate cell walls in
             small grains and concludes that dislocations move individually and escape through the
             surface.
               By  returning  once  more  to  Fig.  39  we  conclude that  most  curves have  features
             similar to another, but  taken all together there is no clearly visible trend. These curves
             have  been  obtained on  very  different grain sizes, sample thicknesses and  grain size
             to thickness ratios, but  do not  show a distinct trend whether one of  these parameters
             decisively governs fatigue life in microscopic samples. Of course Cu can be prepared in
             a broad range of tensile strengths. From over 500 MPa down to values that are difficult
             to specify, especially when necking, as is usual in fatigue tests on microscopic samples.
             is not taken into account (Le. engineering rather than effective stress is used). Obviously
             the  initial tensile strength is a decisive parameter for the duration of  the fatigue life,
             particularly in the low-cycle regime, but in the high-cycle range many crossovers can be
             observed. It finally appears that many other factors, such as texture, crystalline defect
             density and surface defects, play an equally important role.
               Nevertheless, the question of  size effects in fatigue that are related to the proximity
             of  the  surface, where dislocations can escape, is of  scientific intcrcst. In  view of  the
             diversity of  the results presented on small-grained Cu, such studies have to be camed
             out with coarse-grained samples prepared from the same base material. In the following
             section we  will present results that were obtained from studies on  thin Cu  wires and
             ribbons.

             Size Efect in the Fatigue Behavior of Thin Cu Wires and Foils

               Results of  fatigue tests  on  micro-Cu  wires  with  bamboo  structures which  is  the
             coarsest grain size possible in  wires are given  in  Fig. 40.  The S-N  curves obtained
             on  30,  SO  and  95  km diameter wires show that the fatigue life at  stress amplitudes
             below  half  the  tensile  strength  of  thin  wire  is  2  to  3  decades longer  than  for  the
             thick ones. These wires have been annealed for 2 h at 600°C and are therefore highly
             ductile  (for  their  mechanical properties  see  Table  5). Nevertheless, the  thick  wire
             that fails first, shows a brittle transgranular fracture above  IO4  cycles (Fig. 35 right),
             whereas the thin wire always shows severe necking, even at the highest cycles measured
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