Page 467 - Instrumentation Reference Book 3E
P. 467

r
            450  Electrical measurements



                          d.c. I/P
                          attenuator/      converter        Display
                          amplifier
                                       1



                         a.c. voltage              Control
                         a.c.1d.c.                 computational
                                                   facilities


                                              Control









                                   1  t
                         Resistance
                         measurement



                                    iR,  , iR,
                Four-terminal   4
                measurement      I
            Figure 20.30  Elementsof DVMIDMM.


            band  from  40Hz  to  20kHz.  This  voltmeter  is   standard  resistor.  A.c.  and  d.c.  current  meas-
            capable of measuring over a range from 12.5 mV   urements  use  a  shunt  across which a voltage is
            to  600V  in  a  frequency  band  from  lOHz  to   developed. This voltage is then measured by the
            1 MHz with reduced accuracy.             ADC.
              In true rms sensing instruments  the manufac-
            turer  often  specifies  the  maximum  permissible   20.3.2.4  Control and post-measurement
            crest factor for the instrument. The crest factor   computational facilities
            is  the  ratio  of  the  peak  value  of  the  periodic   The  control  element  in  DVMs  and  DMMs  is
            signal to its rms value. Typically the maximum   increasingly provided  by  a microprocessor.  The
            permissible crest factor is  5.
                                                     use of the microprocessor also enables the digital
                                                     instrument to provide the user with a large range
            20.3.2.3  Resistance  and current measurement   of post-measurement storage and computational
                                                     facilities. These may include:
            Resistance measurement  is provided  by  passing
            a known current through the resistor and meas-   (1)  The collection and storage of a set of readings
            uring  the voltage  drop  across  it.  Four-terminal   with a given time interval between readings.
            methods,  as  shown  in  Figure  20.30, enable  the   (2)  The application of  scaling and offset calcula-
            effect  of  lead  resistance  to  be  reduced.  High-   tions to the readings to provide an output of
            precision  DMMs  employ  ratiometric  methods   the form y  = mx + c, where x is the reading
            in  which  the  same  current  is  passed  through   and  m  and  c  are  constants  input  by  the
            both  the  unknown  resistance  and  a  standard   operator.  This  enables  the  measured  value
            resistance,  and  the  unknown  resistance is  com-   to be  output in engineering units.
            puted  from the  ratio  of  the  voltages  developed   (3) Testing  readings  to  ascertain  whether  they
            across  the  two  resistances and the  value  of  the   are  within  preset  limits.  In  this  mode  the
   462   463   464   465   466   467   468   469   470   471   472