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202    Cha pte r  F o u r





                                                                    V2

                                                                     Is2
                                                           V1
                                                                    V4



                                                          Is1
                                                               V3




                    FIGURE 4.50  Stripline in an arbitrary multilayered structure.

                    port (port 3) defined on the bottom plane with respect to the ideal ground plane. The S
                    parameters are computed in Figure 4.52. The results have been compared between
                    MFDM and Sonnet (an electromagnetic solver).
                       The good correlation demonstrates the validity of modal decomposition. The
                    coupling between port 1 and port 3 (coupling between the signal line and power-ground
                    plane) is clearly captured in Figure 4.52. For complex structures, modal decomposition
                    along with the finite-difference method provides around two to three orders of magnitude
                    speedup in computation time compared with full-wave solvers. This concept can be
                    extended to analyze a multitude of signal lines in the presence of multiple planes [56].
                       For the modeling of power-ground planes, Table 4.7 gives a qualitative comparison
                    of some of the available methods that are based on the 2D Helmholtz equation. For
                    planes having complicated structures due to via holes and slits, finite difference method
                    is very efficient and can be used for multilayered structures based on MFDM. The cavity











                                                    Port 2
                                    Port 1


                                                                          Port 3







                    FIGURE 4.51  Test structure.
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