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Intr oduction to System-on-Chip (SOC)     75




                                     Digital block
                                                         Digital block
                       Noise Generation
                    • Increased digital logic
                    • Higher speeds of operation
                    • Sharp slew rates
                                                            Analog       Noise Sensitivity
                                                                     • Increased signal resolution
                                                                     • Higher performance
                                      RF        PA       Digital block   • Lower operating voltages




               FIGURE 2.26  SOC mixed-signal scaling challenge.



                    generated, where dI/dt is the current slew rate. Improper power grid structure, high
                    clock speeds and clock skew, and very sharp transition times on the signals can all
                    contribute to the noise that gets generated on the die. Given the severity of the substrate
                    noise issue, several techniques and approaches have been discussed and attempted to
                    minimize, if not eliminate, this issue. The challenges in addressing the issue lie in the
                    fact that in order to analyze the performance degradation of noise on sensitive analog
                    circuits, a good measure of the noise generated is needed, and for the huge, complex
                    SOC designs being talked about here, this process is computationally prohibitive, hence
                    the need to accurately model the noise sources from digital blocks. It is important that
                    the SOC design planning phase captures the process of enabling noise management by
                    careful planning and modeling of various noise sensitivities and ensuring that guidelines
                    are followed to minimize substrate noise injection, thus enabling the successful
                    integration of analog and RF components. Noise sensitivity analysis can involve the
                    identification of the sensitive circuits on the die and a specification of the maximum
                    amount of substrate noise these circuits can tolerate. Common guidelines and techniques
                    that are followed include

                        •  Physically separating the power domains for noisy and sensitive circuitry
                        •  Reducing the impedance on the power/ground network
                        •  Ensuring a good distribution of power and ground pads to minimize the
                           effective inductance
                        •  Minimizing the inductance on the package
                        •  Adding on-chip decoupling capacitors wherever possible
                        •  Placing guard rings that are tied to a quiet supply around sensitive circuits
                        •  Using a low-impedance backside contacting to obtain good noise rejection
                       One of the technological developments in the area of mixed-signal integration has
                    been in the development of digital RF techniques to overcome the challenges of
                    integrating RF components in advanced CMOS technologies. RF components today
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