Page 135 - Sami Franssila Introduction to Microfabrication
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114 Introduction to Microfabrication



                          Design (CAD file)
                                        Mask writing tool and process

                          Mask
                                        Optical lithography tool, l, NA

                          Aerial image
                                        Focus, dose, wafer topography, reflections, thin film interference

                          Intensity image in resist
                                        Resist photochemistry, post-exposure bake

                          Latent image
                                        Development

                          Resist image
                                        Etching
                          Physical structure on wafer
            Figure 10.10 Lithography information flow. Adapted from Brunner, T. (1997), by permission of IEEE


                            Aerial image & standing waves          Intensity inside resist
                            (optical computations)


                                                                   Spatial concentration
                            Exposure kinetics and diffusion during
                            bake (photochemical models)            of the photoactive
                                                                   compound

                            Developement kinetics and etch algorithm  Developed resist
                            (specialized topography simulation)
                                                                   profile
            Figure 10.11 Modules of lithography simulation. Redrawn after Neureuther, A.R. & C.A. Mack (1997), by permission
            of SPIE

            higher accuracy is possible. These steps have been mod-  10.6 LITHOGRAPHY PRACTICE
            elled with good success even though an understanding
            of many basic mechanisms in resist exposure and devel-  After lithography, various processes are possible, and all
            opment is yet to be uncovered.               of them exhibit rather different requirements for resists
              SAMPLE 2D simulator contains optical lithogra-  in terms of optimum thickness and profile, chemical
            phy models. Lithography simulation input parameters  stability, thermal and mechanical specifications, and
            include light source data like wavelength, exposure dose,  so on (Figure 10.13). Resists face a serious scaling
            numerical aperture and coherence; resist thickness and  trade-off: thickness has to be scaled down for better
            Dill parameters A, B and C; wafer and resist refrac-  resolution, but etch resistance and implant-blocking
            tive indices and development rate parameters. SAM-  capability cannot be sacrificed; and thin resists are also
            PLE can predict resist profiles with standing waves  more prone to pinholes. New resist chemistries based on
            (Figure 10.12).                              aromatic and fluoropolymers are being developed. After
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