Page 197 - MEMS Mechanical Sensors
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186                                                                  Inertial Sensors

                                                      Metal contacts
                                                            Damping holes







                          Silicon
                          proof mass
                               Polysilicon
                               top/bottom  Polysilicon
                               electrode  stiffeners  Proof mass
                                                    suspension beams

                                   Cross-sectional
                                   view

                 Figure 8.11  High-performance capacitive accelerometer using a combination of surface and
                 bulk-micromachining techniques. The polysilicon electrodes include stiffening ribs. (After: [33].)




                 read-out electronics on the same chip. These comprise a MOS transistor in close
                 proximity to the piezoelectric sensing element to minimize charge leakage. The
                 accelerometer has a sensitivity of 1.5 mV/G with a flat frequency response of 3 Hz to
                 3 kHz.
                    Lead zirconate titanate (PZT) is another piezoelectric material often used for
                 accelerometers. It can be sputtered at temperatures around 550°C to form thin-films
                 of approximately 1 µm. Nemirovsky et al. [35] describe an accelerometer based on
                 this technique, which resulted in a sensitivity of 320 mV/G and a very wide band-
                 width from 1 Hz to 200 kHz. A more recent device is presented by Beeby et al. [36],
                 which also uses PZT as piezoelectric material but employs a thick-film screen-
                 printing technique to deposit layers of up to 60-µm thickness. The design of the sens-
                 ing element and a SEM photograph are shown in Figure 8.12.
                    The fabrication process is simple and the yield was shown to be very high. The
                                               2
                 sensitivity was given as 16 pC/m/s , which was considerably higher than the devices
                 using thin, sputtered zinc oxide (ZnO) layers.



                 8.2.2.4  Tunneling Accelerometers
                 The tunneling current from a sharp tip to an electrode is an exponential function of
                 the tip-electrode distance and hence can be used for position measurement of a proof
                 mass. The tunneling current is given by

                                          I = I exp (−βφ z )                           (8.6)
                                              0

                 where I is a scaling current dependent on material and tip shape (a typical value is
                       0
                                                                              –1/2
                       –6
                 1.4 10 A), β is a conversion factor with a typical value of 10.25 eV /nm, φ is the
                 tunnel barrier height with a typical value of 0.5 eV, and z is the tip/electrode dis-
                 tance. The distance between the tunneling tip and the electrode has to be precisely
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